http://hdl.handle.net/2027.42/60937 http://deepblue.lib.umich.edu/retrieve/219401 http://hdl.handle.net/2027.42/60937 Search the Channel search http://deepblue.lib.umich.edu/simple-search http://hdl.handle.net/2027.42/64247 Title: The Voyage of the Mayflower - Design & Marketing Notes<br/><br/>Authors: Ludwig, Kenneth W.; Boyd, Laurence A. II<br/><br/>Abstract: These are the design and marketing notes for the 1980s-era educational computer game "The Voyage of the Mayflower" Thu, 15 Oct 2009 00:00:00 GMT http://hdl.handle.net/2027.42/64246 Title: Eigenvalues and eigenvectors of finite, low rank perturbation of large random matrices<br/><br/>Authors: Benaych-Georges, Florent; Nadakuditi, Raj Rao<br/><br/>Abstract: In this paper, we consider the eigenvalues and eigenvectors of finite, lowrank perturbations of random matrices. Specifically, we prove almost sure convergenceof the extreme eigenvalues and appropriate projections of the corresponding eigenvectorsof the perturbed matrix for additive and multiplicative perturbation models.The limiting non-random value is shown to depend explicitly on the limiting spectralmeasure and the assumed perturbation model via integral transforms that correspondto very well known objects in free probability theory that linearize non-commutativefree additive and multiplicative convolution. Moreover, we uncover a remarkable phasetransition phenomenon whereby the large matrix limit of the extreme eigenvalues of theperturbed matrix differs from that of the original matrix if and only if the eigenvaluesof the perturbing matrix are above a certain critical threshold. This critical threshold isintimately related to the same aforementioned integral transforms.We examine the consequence of this eigenvalue phase transition on the associatedeigenvectors and generalize our results to examine the singular values and vectors of finite,low rank perturbations of rectangular random matrices. The analysis brings into sharpfocus the analogous connection with rectangular free probability. Various extensions ofour results are discussed. Thu, 15 Oct 2009 00:00:00 GMT http://hdl.handle.net/2027.42/61348 Title: RF MEMS technology for millimeter-wave radar sensors<br/><br/>Authors: Van Caekenberghe, Koen A. P. A.<br/><br/>Abstract: The dissertation discusses RF MEMS technology for millimeter-wave radar sensors. RF MEMS, which stands for radio frequency micro-electromechanical system, and radar sensor fundamentals are briefly introduced. Of particular interest are: Firstly, a self-aligned fabrication process for capacitive fixed-fixed beam RF MEMS components is disclosed. It enables scaling of the critical dimensions and reduces the number of processing steps by 40% as compared with a conventional RF MEMS fabrication process. Scaling of the critical dimensions of RF MEMS components offers the potential of submicrosecond T/R switching times. RF MEMS varactors with beam lengths of 30 μm are demonstrated using the self-aligned fabrication process, and the performance of a 4 by 4 RF MEMS varactor bank is discussed as well. At 20 GHz, the measured capacitance values range between 180.5 fF and 199.2 fF. The measured capacitance ratio is 1.15, when a driving voltage of 35 V is applied, and the measured loaded Q factor ranges between 14.5 and 10.8. The measured cold-switched power handling is 200 mW. The simulated switching time is 354.6 ns. Secondly, an analog RF MEMS slotline TTD phase shifter is disclosed, for use in conjunction with ultra wideband (UWB) tapered slot antennas, such as the Vivaldi aerial and the double exponentially tapered slot antenna. It is designed for transistor to transistor logic (TTL) bias voltage levels and exhibits a measured phase shift of 28.2°/dB (7.8 ps/dB) and 59.2°/cm at 10 GHz, maintaining a 75 Ω; differential impedance match (S_{11_dd} ≤ -15.8 dB). The input third-order intercept point (IIP3) is 5 dBm at 10 GHz for a Δf of 50 kHz, measured in a 100 Ω differential transmission line system. Mon, 01 Jan 2007 00:00:00 GMT http://hdl.handle.net/2027.42/60941 Title: Micromachined Heat Exchanger for Cryosurgical Probe<br/><br/>Authors: Zhu, W.; Gianchandani, Y.B.; Nellis, G.F.; Klein, S.A. Thu, 01 Sep 2005 00:00:00 GMT