Diffraction by a Thick Impedance Edge and an Impedance Step Protrusion
dc.contributor.author | Volakis, John Leonidas | en_US |
dc.contributor.author | Ricoy, Mark A. | en_US |
dc.date.accessioned | 2006-02-17T19:50:21Z | |
dc.date.available | 2006-02-17T19:50:21Z | |
dc.date.issued | 1985-09 | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/21576 | |
dc.format.extent | 35342 bytes | |
dc.format.extent | 1540477 bytes | |
dc.format.extent | 2970 bytes | |
dc.format.mimetype | text/plain | |
dc.format.mimetype | application/pdf | |
dc.format.mimetype | text/plain | |
dc.language | eng | en_US |
dc.language.iso | en_US | |
dc.publisher | University of Michigan. Radiation Laboratory | en_US |
dc.title | Diffraction by a Thick Impedance Edge and an Impedance Step Protrusion | en_US |
dc.type | Technical Report | en_US |
dc.subject.hlbtoplevel | Engineering | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/21576/2/rl2555.0001.001.pdf | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/21576/1/rl2555.0001.001.txt | en_US |
dc.owningcollname | Engineering, College of - Technical Reports |
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