View Item 

Show simple item record

A high resolution wire scanner for micron-size profile measurements at the SLC

dc.contributor.authorFulton, Robert S.en_US
dc.contributor.authorHaggerty, J.en_US
dc.contributor.authorJared, R.en_US
dc.contributor.authorJones, R.en_US
dc.contributor.authorKadyk, J. A.en_US
dc.contributor.authorField, C.en_US
dc.contributor.authorKozanecki, W.en_US
dc.contributor.authorKoska, Wayne A.en_US
dc.date.accessioned2006-04-07T20:55:50Z
dc.date.available2006-04-07T20:55:50Z
dc.date.issued1989-01-01en_US
dc.identifier.citationFulton, R., Haggerty, J., Jared, R., Jones, R., Kadyk, J., Field, C., Kozanecki, W., Koska, W. (1989/01/01)."A high resolution wire scanner for micron-size profile measurements at the SLC." Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment 274(1-2): 37-44. <http://hdl.handle.net/2027.42/28112>en_US
dc.identifier.urihttp://www.sciencedirect.com/science/article/B6TJM-473DDW9-RY/2/57eb2893de0ed164a7d886902698fb4cen_US
dc.identifier.urihttps://hdl.handle.net/2027.42/28112
dc.description.abstractFine conductive fibers have been used to measure transverse beam dimensions of a few microns at the Stanford Linear Collider (SLC). The beam profile is obtained by scanning a fiber across the beam in steps as small as 1 [mu]m, and recording the secondary emission signal at each step, using a charge sensitive amplifier. We first outline the mechanical construction and the analogue electronics of the wire scanner. We then describe its performance in test beams and in actual operation. The article closes with a brief discussion of performance limitations of such a beam profile monitor.en_US
dc.format.extent632975 bytes
dc.format.extent3118 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherElsevieren_US
dc.titleA high resolution wire scanner for micron-size profile measurements at the SLCen_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbsecondlevelNuclear Engineering and Radiological Sciencesen_US
dc.subject.hlbtoplevelScienceen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumUniversity of Michigan, Ann Arbor, MI 48109, USAen_US
dc.contributor.affiliationotherLawrence Berkeley Laboratory, Berkeley, CA 94720, USAen_US
dc.contributor.affiliationotherLawrence Berkeley Laboratory, Berkeley, CA 94720, USAen_US
dc.contributor.affiliationotherLawrence Berkeley Laboratory, Berkeley, CA 94720, USAen_US
dc.contributor.affiliationotherLawrence Berkeley Laboratory, Berkeley, CA 94720, USAen_US
dc.contributor.affiliationotherLawrence Berkeley Laboratory, Berkeley, CA 94720, USAen_US
dc.contributor.affiliationotherStanford Linear Accelerator Center, Stanford University, Stanford, CA 94309, USAen_US
dc.contributor.affiliationotherStanford Linear Accelerator Center, Stanford University, Stanford, CA 94309, USAen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/28112/1/0000561.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1016/0168-9002(89)90362-8en_US
dc.identifier.sourceNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipmenten_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


Files in this item

Name:
0000561.pdf
Size:
618.1KB
Format:
PDF
View/Open

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.