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Process alternatives and scaling limits for high-density silicon tactile imagers
Suzuki, K.; Najafi, Khalil; Wise, K. D.
1990-04
Citation:Suzuki, K., Najafi, K., Wise, K. D. (1990/04)."Process alternatives and scaling limits for high-density silicon tactile imagers." Sensors and Actuators A: Physical 23(1-3): 915-918. <http://hdl.handle.net/2027.42/28661>
Abstract: In this paper the process complexities and parasitic substrate coupling effects are compared for several different high-density capacitive tactile imagers. The dissolved-wafer process using diffused bulk-silicon row lines and metal-on-glass columns is found to offer the simplest process and fastest response, requiring only five non-critical masks and producing a settling time for the column charge of about 1 [mu]s. Using this process, a 1024-element array with a force range of 1 gm and a spatial resolution of 500 [mu]m produces a force resolution equivalent to seven bits. Scaled to a 4096-element array, this same process should produce a force resolution of nearly six bits for the same force range and a spatial resolution of 250 [mu]m.