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Determining the phase of line objects by measuring their intensity in dark field and bright field illumination

dc.contributor.authorAnsley, David A.en_US
dc.date.accessioned2006-04-17T16:38:33Z
dc.date.available2006-04-17T16:38:33Z
dc.date.issued1973-06en_US
dc.identifier.citationAnsley, David A. (1973/06)."Determining the phase of line objects by measuring their intensity in dark field and bright field illumination." Optics Communications 8(2): 140-141. <http://hdl.handle.net/2027.42/33865>en_US
dc.identifier.urihttp://www.sciencedirect.com/science/article/B6TVF-46FR17H-KD/2/b9c9f9baa2dad7214cc4062ea9a45dc7en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/33865
dc.description.abstractThe in situ phase of a transparent line object can be calculated from measurements of its bright field and dark field intensity. If the sampling aperture is a slit, the background can be subtracted out for increased accuracy. This method can measure phase over a range of approximately 3[deg] to 180[deg]. The theory has been verified by means of an indirect experiment.en_US
dc.format.extent151808 bytes
dc.format.extent3118 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherElsevieren_US
dc.titleDetermining the phase of line objects by measuring their intensity in dark field and bright field illuminationen_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbsecondlevelElectrical Engineeringen_US
dc.subject.hlbtoplevelScienceen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumElectrical and Computer Engineering Department, University of Michigan, Ann Arbor, Michigan 48107, USAen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/33865/1/0000126.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1016/0030-4018(73)90156-9en_US
dc.identifier.sourceOptics Communicationsen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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