Advanced statistical methods in biometric research. By C. Radhakrishna Rao. John Wiley & Sons, Inc., New York, N. Y. 1952. 390 pp.
dc.contributor.author | Spuhler, J. N. | en_US |
dc.date.accessioned | 2006-04-28T15:48:43Z | |
dc.date.available | 2006-04-28T15:48:43Z | |
dc.date.issued | 1954-06 | en_US |
dc.identifier.citation | Spuhler, J. N. (1954)."Advanced statistical methods in biometric research. By C. Radhakrishna Rao. John Wiley & Sons, Inc., New York, N. Y. 1952. 390 pp.." American Journal of Physical Anthropology 12(2): 268-270. <http://hdl.handle.net/2027.42/37452> | en_US |
dc.identifier.issn | 0002-9483 | en_US |
dc.identifier.issn | 1096-8644 | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/37452 | |
dc.description.abstract | No Abstract. | en_US |
dc.format.extent | 207866 bytes | |
dc.format.extent | 3118 bytes | |
dc.format.mimetype | application/pdf | |
dc.format.mimetype | text/plain | |
dc.language.iso | en_US | |
dc.publisher | Wiley Subscription Services, Inc., A Wiley Company | en_US |
dc.subject.other | Life and Medical Sciences | en_US |
dc.subject.other | Anthropology | en_US |
dc.title | Advanced statistical methods in biometric research. By C. Radhakrishna Rao. John Wiley & Sons, Inc., New York, N. Y. 1952. 390 pp. | en_US |
dc.type | Article | en_US |
dc.rights.robots | IndexNoFollow | en_US |
dc.subject.hlbsecondlevel | Anthropology | en_US |
dc.subject.hlbtoplevel | Social Sciences | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | University of Michigan | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/37452/1/1330120224_ftp.pdf | en_US |
dc.identifier.doi | http://dx.doi.org/10.1002/ajpa.1330120224 | en_US |
dc.identifier.source | American Journal of Physical Anthropology | en_US |
dc.owningcollname | Interdisciplinary and Peer-Reviewed |
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