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| dc.contributor.author | Mazumder, Pinaki | en_US |
| dc.date.accessioned | 2006-09-08T20:58:25Z | |
| dc.date.available | 2006-09-08T20:58:25Z | |
| dc.date.issued | 1994-11 | en_US |
| dc.identifier.citation | Mazumder, Pinaki; (1994). "Guest editor's introduction." Journal of Electronic Testing 5(4): 319-320. <http://hdl.handle.net/2027.42/43014> | en_US |
| dc.identifier.issn | 0923-8174 | en_US |
| dc.identifier.issn | 1573-0727 | en_US |
| dc.identifier.uri | https://hdl.handle.net/2027.42/43014 | |
| dc.format.extent | 148318 bytes | |
| dc.format.extent | 3115 bytes | |
| dc.format.mimetype | application/pdf | |
| dc.format.mimetype | text/plain | |
| dc.language.iso | en_US | |
| dc.publisher | Kluwer Academic Publishers; Springer Science+Business Media | en_US |
| dc.subject.other | Engineering | en_US |
| dc.subject.other | Computer-Aided Engineering (CAD, CAE) and Design | en_US |
| dc.subject.other | Electronic and Computer Engineering | en_US |
| dc.subject.other | Circuits and Systems | en_US |
| dc.title | Guest editor's introduction | en_US |
| dc.type | Article | en_US |
| dc.subject.hlbsecondlevel | Electrical Engineering | en_US |
| dc.subject.hlbtoplevel | Engineering | en_US |
| dc.description.peerreviewed | Peer Reviewed | en_US |
| dc.contributor.affiliationum | The University of Michigan, USA | en_US |
| dc.contributor.affiliationumcampus | Ann Arbor | en_US |
| dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/43014/1/10836_2004_Article_BF00972516.pdf | en_US |
| dc.identifier.doi | http://dx.doi.org/10.1007/BF00972516 | en_US |
| dc.identifier.source | Journal of Electronic Testing | en_US |
| dc.owningcollname | Interdisciplinary and Peer-Reviewed |
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