The half-life of 76 As
dc.contributor.author | Lindstrom, Richard M. | en_US |
dc.contributor.author | Blaauw, M. | en_US |
dc.contributor.author | Fleming, Ronald F. | en_US |
dc.date.accessioned | 2006-09-08T21:06:04Z | |
dc.date.available | 2006-09-08T21:06:04Z | |
dc.date.issued | 2003-09 | en_US |
dc.identifier.citation | Lindstrom, R. M.; Blaauw, M.; Fleming, R. F.; (2003). "The half-life of 76 As." Journal of Radioanalytical and Nuclear Chemistry 257(3): 489-491. <http://hdl.handle.net/2027.42/43130> | en_US |
dc.identifier.issn | 0236-5731 | en_US |
dc.identifier.issn | 1588-2780 | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/43130 | |
dc.description.abstract | In the course of making high-accuracy measurements of arsenic, we found that the most recently published and compiled half-life of 76 As did not agree with our data as well as the earlier accepted value. To redetermine this parameter, 76 As sources were measured on four Ge gamma detector systems, and an exponential function was fitted to the decay data by two different nonlinear least-squares methods. We obtained T 1/2 = 1.09379 days with a standard uncertainty of 0.00045 days. This result is 1.5% higher than the most recent value, but is in agreement with the older, less precise, consensus value. | en_US |
dc.format.extent | 300573 bytes | |
dc.format.extent | 3115 bytes | |
dc.format.mimetype | application/pdf | |
dc.format.mimetype | text/plain | |
dc.language.iso | en_US | |
dc.publisher | Kluwer Academic Publishers; Kluwer Academic Publishers/Akadémiai Kiadó ; Springer Science+Business Media | en_US |
dc.subject.other | Chemistry | en_US |
dc.subject.other | Inorganic Chemistry | en_US |
dc.subject.other | Physical Chemistry | en_US |
dc.subject.other | Diagnostic Radiology | en_US |
dc.subject.other | Nuclear Physics, Heavy Ions, Hadrons | en_US |
dc.title | The half-life of 76 As | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Chemical Engineering | en_US |
dc.subject.hlbsecondlevel | Chemistry | en_US |
dc.subject.hlbsecondlevel | Materials Science and Engineering | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.subject.hlbtoplevel | Engineering | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Department of Nuclear Engineering and Radiological Sciences, The University of Michigan, Ann Arbor, MI, 48109-2104, USA | en_US |
dc.contributor.affiliationother | Analytical Chemistry Division, National Institute of Standards and Technology, Gaithersburg, MD, 20899-8395, USA | en_US |
dc.contributor.affiliationother | Interfaculty Reactor Institute, University of Technology, Delft Mekelweg 15, 2629 JB, Delft, The Netherlands | en_US |
dc.contributor.affiliationumcampus | Ann Arbor | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/43130/1/10967_2004_Article_5117002.pdf | en_US |
dc.identifier.doi | http://dx.doi.org/10.1023/A:1025415926281 | en_US |
dc.identifier.source | Journal of Radioanalytical and Nuclear Chemistry | en_US |
dc.owningcollname | Interdisciplinary and Peer-Reviewed |
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