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The half-life of 76 As

dc.contributor.authorLindstrom, Richard M.en_US
dc.contributor.authorBlaauw, M.en_US
dc.contributor.authorFleming, Ronald F.en_US
dc.date.accessioned2006-09-08T21:06:04Z
dc.date.available2006-09-08T21:06:04Z
dc.date.issued2003-09en_US
dc.identifier.citationLindstrom, R. M.; Blaauw, M.; Fleming, R. F.; (2003). "The half-life of 76 As." Journal of Radioanalytical and Nuclear Chemistry 257(3): 489-491. <http://hdl.handle.net/2027.42/43130>en_US
dc.identifier.issn0236-5731en_US
dc.identifier.issn1588-2780en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/43130
dc.description.abstractIn the course of making high-accuracy measurements of arsenic, we found that the most recently published and compiled half-life of 76 As did not agree with our data as well as the earlier accepted value. To redetermine this parameter, 76 As sources were measured on four Ge gamma detector systems, and an exponential function was fitted to the decay data by two different nonlinear least-squares methods. We obtained T 1/2 = 1.09379 days with a standard uncertainty of 0.00045 days. This result is 1.5% higher than the most recent value, but is in agreement with the older, less precise, consensus value.en_US
dc.format.extent300573 bytes
dc.format.extent3115 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherKluwer Academic Publishers; Kluwer Academic Publishers/Akadémiai Kiadó ; Springer Science+Business Mediaen_US
dc.subject.otherChemistryen_US
dc.subject.otherInorganic Chemistryen_US
dc.subject.otherPhysical Chemistryen_US
dc.subject.otherDiagnostic Radiologyen_US
dc.subject.otherNuclear Physics, Heavy Ions, Hadronsen_US
dc.titleThe half-life of 76 Asen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelChemical Engineeringen_US
dc.subject.hlbsecondlevelChemistryen_US
dc.subject.hlbsecondlevelMaterials Science and Engineeringen_US
dc.subject.hlbtoplevelScienceen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Nuclear Engineering and Radiological Sciences, The University of Michigan, Ann Arbor, MI, 48109-2104, USAen_US
dc.contributor.affiliationotherAnalytical Chemistry Division, National Institute of Standards and Technology, Gaithersburg, MD, 20899-8395, USAen_US
dc.contributor.affiliationotherInterfaculty Reactor Institute, University of Technology, Delft Mekelweg 15, 2629 JB, Delft, The Netherlandsen_US
dc.contributor.affiliationumcampusAnn Arboren_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/43130/1/10967_2004_Article_5117002.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1023/A:1025415926281en_US
dc.identifier.sourceJournal of Radioanalytical and Nuclear Chemistryen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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