Show simple item record

Adhesion at a heterophase interface: First-principles study of Mo(001)/MoSi 2 (001)

dc.contributor.authorHong, T.en_US
dc.contributor.authorSmith, J. R.en_US
dc.contributor.authorSrolovitz, David J.en_US
dc.date.accessioned2006-09-11T17:15:18Z
dc.date.available2006-09-11T17:15:18Z
dc.date.issued1994-09en_US
dc.identifier.citationHong, T.; Smith, J. R.; Srolovitz, D. J.; (1994). "Adhesion at a heterophase interface: First-principles study of Mo(001)/MoSi 2(001)." Interface Science 1 (3): 223-235. <http://hdl.handle.net/2027.42/45997>en_US
dc.identifier.issn0927-7056en_US
dc.identifier.issn1573-2746en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/45997
dc.description.abstractThe bonding characteristics, interfacial energetics, and electronic structure associated with adhesion at the Mo-MoSi 2 (001) heterophase interface are investigated using the first-principles, self-consistent local orbital method. We found both the adhesive energy and peak interfacial strength for the interface to be 10%-15% smaller than the respective values for cleavage along the (001) planes in crystalline Mo and MoSi 2 . The equilibrium interlayer separation between Mo and MoSi 2 is found to lie between the interplanar spacings of crystalline Mo and MoSi 2 . The interfacial adhesive bonding is attributable to the combination of a nearly uniform band of charge accumulation at the interface and directional charge accumulation between atoms across the interface. These first-principles calculations demonstrate that the universal-binding-energy relation can be extended to describe adhesion between dissimilar materials.en_US
dc.format.extent999521 bytes
dc.format.extent3115 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherKluwer Academic Publishers; Springer Science+Business Mediaen_US
dc.subject.otherEngineeringen_US
dc.subject.otherMaterials Processing, Characterization, and Designen_US
dc.subject.otherAdhesionen_US
dc.subject.otherHeterophase Interfaceen_US
dc.subject.otherFirst-principles Electronic Structure Calculationsen_US
dc.titleAdhesion at a heterophase interface: First-principles study of Mo(001)/MoSi 2 (001)en_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelChemical Engineeringen_US
dc.subject.hlbsecondlevelChemistryen_US
dc.subject.hlbsecondlevelMaterials Science and Engineeringen_US
dc.subject.hlbsecondlevelBiological Chemistryen_US
dc.subject.hlbtoplevelScienceen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.subject.hlbtoplevelHealth Sciencesen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Materials Science and Engineering, University of Michigan, 48109-2136, Ann Arbor, MIen_US
dc.contributor.affiliationumDepartment of Materials Science and Engineering, University of Michigan, 48109-2136, Ann Arbor, MIen_US
dc.contributor.affiliationotherPhysics Department, General Motors Research and Development Center, 48090-9055, Warren, MIen_US
dc.contributor.affiliationumcampusAnn Arboren_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/45997/1/10793_2004_Article_BF00198149.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1007/BF00198149en_US
dc.identifier.sourceInterface Scienceen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


Files in this item

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.