View Item 

Show simple item record

Low-frequency scattering by rectangular dielectric particles

dc.contributor.authorHerrick, Donald F.en_US
dc.contributor.authorSenior, Thomas B. A.en_US
dc.date.accessioned2006-09-11T18:30:33Z
dc.date.available2006-09-11T18:30:33Z
dc.date.issued1977-06en_US
dc.identifier.citationHerrick, D. F.; Senior, T. B. A.; (1977). "Low-frequency scattering by rectangular dielectric particles." Applied Physics 13(2): 175-183. <http://hdl.handle.net/2027.42/47029>en_US
dc.identifier.issn0340-3793en_US
dc.identifier.issn1432-0630en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/47029
dc.description.abstractThe field scattered by a homogeneous isotropic dielectric particle illuminated by a low-frequency plane electromagnetic wave is expressed in terms of a single polarizability tensor which is a function of only the geometry of the particle and a material parameter τ representing either the relative permittivity or permeability of the dielectric. The mathematical formulation is specialized to the case of a rectangular parallelepiped and numerical techniques are developed for computing the tensor elements. Specific data are presented for the tensor elements of rectangular parallelepipeds having square cross sections and are compared to the results obtained for spheroids and right circular cylinders of similar dimensions.en_US
dc.format.extent533031 bytes
dc.format.extent3115 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.language.isoen_US
dc.publisherSpringer-Verlagen_US
dc.subject.other77.20en_US
dc.subject.otherOperating Procedures, Materials Treatmenten_US
dc.subject.other84en_US
dc.subject.otherPhysicsen_US
dc.subject.otherOptical and Electronic Materialsen_US
dc.subject.otherSurfaces and Interfaces, Thin Filmsen_US
dc.subject.otherCharacterization and Evaluation Materialsen_US
dc.subject.otherNanotechnologyen_US
dc.subject.otherCondensed Matteren_US
dc.titleLow-frequency scattering by rectangular dielectric particlesen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbsecondlevelMathematicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumRadiation Laboratory, The University of Michigan, 48109, Ann Arbor, MI, USAen_US
dc.contributor.affiliationumRadiation Laboratory, The University of Michigan, 48109, Ann Arbor, MI, USAen_US
dc.contributor.affiliationumcampusAnn Arboren_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/47029/1/339_2004_Article_BF00882478.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1007/BF00882478en_US
dc.identifier.sourceApplied Physicsen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


Files in this item

Name:
339_2004_Article_BF00882478.pdf
Size:
520.5KB
Format:
PDF
View/Open

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.