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Focused ion beams in future nanoscale probe recording

dc.contributor.authorLitvinov, Dmitrien_US
dc.contributor.authorKhizroev, Sakhraten_US
dc.date.accessioned2006-12-19T19:24:32Z
dc.date.available2006-12-19T19:24:32Z
dc.date.issued2002-04-01en_US
dc.identifier.citationLitvinov, Dmitri; Khizroev, Sakhrat (2002). "Focused ion beams in future nanoscale probe recording." Nanotechnology. 13(2): 179-184. <http://hdl.handle.net/2027.42/49220>en_US
dc.identifier.issn0957-4484en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/49220
dc.description.abstractFocused ion beam (FIB) applications in the field of nanoscale probe recording are explored. A detailed description of how to use FIBs for trimming longitudinal and perpendicular magnetic recording and playback devices to dimensions of less than 100 nm is presented. An experiment was conducted to demonstrate that the magnetoresistive property of a read element, e.g. a giant-magnetoresistive sensor, strongly depends on the focused ion current and the beam accelerating voltage.en_US
dc.format.extent3118 bytes
dc.format.extent220060 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.language.isoen_US
dc.publisherIOP Publishing Ltden_US
dc.titleFocused ion beams in future nanoscale probe recordingen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumApplied Physics, University of Michigan, Ann Arbor, MI, USAen_US
dc.contributor.affiliationotherElectrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, PA, USAen_US
dc.contributor.affiliationumcampusAnn Arboren_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/49220/2/na2210.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1088/0957-4484/13/2/310en_US
dc.identifier.sourceNanotechnology.en_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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