View Item 

Show simple item record

Nanostructuring and High Thermoelectric Efficiency in p-Type Ag(Pb 1 –  y Sn y ) m SbTe 2 +  m

dc.contributor.authorAndroulakis, J.en_US
dc.contributor.authorHsu, K.  F.en_US
dc.contributor.authorPcionek, R.en_US
dc.contributor.authorKong, H.en_US
dc.contributor.authorUher, Ctiraden_US
dc.contributor.authorD'Angelo, Jonathan Jamesen_US
dc.contributor.authorDowney, A.en_US
dc.contributor.authorHogan, T.en_US
dc.date.accessioned2007-07-11T18:16:58Z
dc.date.available2007-07-11T18:16:58Z
dc.date.issued2006-05-02en_US
dc.identifier.citationAndroulakis, J.; Hsu, K. F.; Pcionek, R.; Kong, H.; Uher, C.; D'Angelo, J. J.; Downey, A.; Hogan, T. (2006). "Nanostructuring and High Thermoelectric Efficiency in p-Type Ag(Pb 1 –  y Sn y ) m SbTe 2 +  m We thank Prof. S. D. Mahanti for useful discussions. The 200 kV Field Emission Gun Transmission Electron Microscope was acquired with an NSF grant (DMR-0079578) (MSU Center for Advanced Microscopy). Financial support from the Office of Naval Research (MURI program) is gratefully acknowledged. Supporting Information is available online from Wiley InterScience or from the author. ." Advanced Materials 18(9): 1170-1173. <http://hdl.handle.net/2027.42/55241>en_US
dc.identifier.issn0935-9648en_US
dc.identifier.issn1521-4095en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/55241
dc.description.abstractNo abstract.en_US
dc.format.extent410413 bytes
dc.format.extent3118 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.publisherWILEY-VCH Verlagen_US
dc.subject.otherChemistryen_US
dc.subject.otherPolymer and Materials Scienceen_US
dc.titleNanostructuring and High Thermoelectric Efficiency in p-Type Ag(Pb 1 –  y Sn y ) m SbTe 2 +  men_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelEngineering (General)en_US
dc.subject.hlbsecondlevelMaterials Science and Engineeringen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Physics, University of Michigan, Ann Arbor, MI 48109, USAen_US
dc.contributor.affiliationumDepartment of Physics, University of Michigan, Ann Arbor, MI 48109, USAen_US
dc.contributor.affiliationotherDepartment of Chemistry, Michigan Sate University, East Lansing, MI 48824-1793, USAen_US
dc.contributor.affiliationotherDepartment of Chemistry, Michigan Sate University, East Lansing, MI 48824-1793, USAen_US
dc.contributor.affiliationotherDepartment of Chemistry, Michigan Sate University, East Lansing, MI 48824-1793, USAen_US
dc.contributor.affiliationotherElectrical and Computer Engineering Department, Michigan State University, East Lansing, MI 48824-1226, USAen_US
dc.contributor.affiliationotherElectrical and Computer Engineering Department, Michigan State University, East Lansing, MI 48824-1226, USAen_US
dc.contributor.affiliationotherElectrical and Computer Engineering Department, Michigan State University, East Lansing, MI 48824-1226, USAen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/55241/1/1170_ftp.pdfen_US
dc.identifier.doihttp://dx.doi.org/10.1002/adma.200502770en_US
dc.identifier.sourceAdvanced Materialsen_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


Files in this item

Name:
1170_ftp.pdf
Size:
400.7KB
Format:
PDF
View/Open

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.