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Spatial conductivity mapping of carbon nanotube composite thin films by electrical impedance tomography for sensing applications

dc.contributor.authorHou, Tsung-Chinen_US
dc.contributor.authorLoh, Kenneth J.en_US
dc.contributor.authorLynch, Jerome Peteren_US
dc.date.accessioned2008-04-02T14:41:45Z
dc.date.available2008-04-02T14:41:45Z
dc.date.issued2007-08-08en_US
dc.identifier.citationHou, Tsung-Chin; Loh, Kenneth J; Lynch, Jerome P (2007). "Spatial conductivity mapping of carbon nanotube composite thin films by electrical impedance tomography for sensing applications." Nanotechnology. 18(31): 315501 (9pp). <http://hdl.handle.net/2027.42/58135>en_US
dc.identifier.issn0957-4484en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/58135
dc.description.abstractThis paper describes the application of electrical impedance tomography (EIT) to demonstrate the multifunctionality of carbon nanocomposite thin films under various types of environmental stimuli. Carbon nanotube (CNT) thin films are fabricated by a layer-by-layer (LbL) technique and mounted with electrodes along their boundaries. The response of the thin films to various stimuli is investigated by relying on electric current excitation and corresponding boundary potential measurements. The spatial conductivity variations are reconstructed based on a mathematical model for the EIT technique. Here, the ability of the EIT method to provide two-dimensional mapping of the conductivity of CNT thin films is validated by (1) electrically imaging intentional structural defects in the thin films and (2) mapping the film’s response to various pH environments. The ability to spatially image the conductivity of CNT thin films holds many promises for developing multifunctional CNT-based sensing skins.en_US
dc.format.extent3118 bytes
dc.format.extent1020873 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.publisherIOP Publishing Ltden_US
dc.titleSpatial conductivity mapping of carbon nanotube composite thin films by electrical impedance tomography for sensing applicationsen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Civil and Environmental Engineering, University of Michigan, Ann Arbor, MI 48109-2125, USAen_US
dc.contributor.affiliationumDepartment of Civil and Environmental Engineering, University of Michigan, Ann Arbor, MI 48109-2125, USAen_US
dc.contributor.affiliationumDepartment of Civil and Environmental Engineering, University of Michigan, Ann Arbor, MI 48109-2125, USA ; Department of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, MI 48109-2125, USA ;en_US
dc.contributor.affiliationumcampusAnn Arboren_US
dc.identifier.pmid20442481en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/58135/2/nano7_31_315501.pdf
dc.identifier.doihttp://dx.doi.org/10.1088/0957-4484/18/31/315501en_US
dc.identifier.sourceNanotechnology.en_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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