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Ultrafast dynamics and interlayer thermal coupling of hot carriers in epitaxial graphene

dc.contributor.authorSun, Dongen_US
dc.contributor.authorWu, Zong-Kweien_US
dc.contributor.authorDivin, Charles Johnen_US
dc.contributor.authorLi, Xuebinen_US
dc.contributor.authorBerger, Claireen_US
dc.contributor.authorHeer, Walt A. deen_US
dc.contributor.authorFirst, Phillip N.en_US
dc.contributor.authorNorris, Theodore B.en_US
dc.date.accessioned2009-03-03T20:11:54Z
dc.date.available2010-04-14T17:40:06Zen_US
dc.date.issued2009-02en_US
dc.identifier.citationSun, Dong; Wu, Zong-Kwei; Divin, Charles; Li, Xuebin; Berger, Claire; Heer, Walt A. de; First, Phillip N.; Norris, Theodore B. (2009). "Ultrafast dynamics and interlayer thermal coupling of hot carriers in epitaxial graphene." physica status solidi c 6(2): 470-473. <http://hdl.handle.net/2027.42/61906>en_US
dc.identifier.issn1610-1634en_US
dc.identifier.issn1610-1642en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/61906
dc.description.abstractWe report the first application of nondegenerate ultrafast pump-probe spectroscopy to investigate the dynamics of hot Dirac Fermions in epitaxial graphene. The DT spectra can be understood in terms of the effect of hot thermal carrier distributions on interband transitions with no electron-hole interaction. We also investigate the thermal coupling between carriers of doped and undoped layers. The coupling time is found to be below 500fs. (© 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim)en_US
dc.format.extent278626 bytes
dc.format.extent3118 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.publisherWILEY-VCH Verlagen_US
dc.subject.otherPhysicsen_US
dc.titleUltrafast dynamics and interlayer thermal coupling of hot carriers in epitaxial grapheneen_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelElectrical Engineering and Computer Scienceen_US
dc.subject.hlbsecondlevelMaterials Science and Engineeringen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumCenter for Ultrafast Optical Science, University of Michigan, 2200 Bonisteel Blvd., 48109, Ann Arbor, USA ; Phone: +001 734 709 3982, Fax: +001 734 763 4876en_US
dc.contributor.affiliationumCenter for Ultrafast Optical Science, University of Michigan, 2200 Bonisteel Blvd., 48109, Ann Arbor, USAen_US
dc.contributor.affiliationumCenter for Ultrafast Optical Science, University of Michigan, 2200 Bonisteel Blvd., 48109, Ann Arbor, USAen_US
dc.contributor.affiliationumCenter for Ultrafast Optical Science, University of Michigan, 2200 Bonisteel Blvd., 48109, Ann Arbor, USAen_US
dc.contributor.affiliationotherSchool of Physics, Georgia Institute of Technology, 30332, Altanta, USAen_US
dc.contributor.affiliationotherSchool of Physics, Georgia Institute of Technology, 30332, Altanta, USAen_US
dc.contributor.affiliationotherSchool of Physics, Georgia Institute of Technology, 30332, Altanta, USAen_US
dc.contributor.affiliationotherSchool of Physics, Georgia Institute of Technology, 30332, Altanta, USAen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/61906/1/470_ftp.pdf
dc.identifier.doi10.1002/pssc.200880359en_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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