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Redistribution of Aluminum Ions During Processing of Sialon Ceramics

dc.contributor.authorBonnell, Dawn A.en_US
dc.contributor.authorRühle, M.en_US
dc.contributor.authorTien, T. -Y.en_US
dc.date.accessioned2010-04-01T15:26:13Z
dc.date.available2010-04-01T15:26:13Z
dc.date.issued1986-08en_US
dc.identifier.citationBONNELL, D. A.; RÜHLE, M.; TIEN, T.-Y. (1986). "Redistribution of Aluminum Ions During Processing of Sialon Ceramics." Journal of the American Ceramic Society 69(8): 623-627. <http://hdl.handle.net/2027.42/65916>en_US
dc.identifier.issn0002-7820en_US
dc.identifier.issn1551-2916en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/65916
dc.format.extent626385 bytes
dc.format.extent3110 bytes
dc.format.mimetypeapplication/pdf
dc.format.mimetypetext/plain
dc.publisherBlackwell Publishing Ltden_US
dc.rights1986 by The American Ceramic Society, Inc.en_US
dc.titleRedistribution of Aluminum Ions During Processing of Sialon Ceramicsen_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelMaterials Science and Engineeringen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Materials and Metallurgical Engineering, The University of Michigan, Ann Arbor, Michigan 48109, and Max-Planck-Institut fÜr Metallforschung, Institut fÜr Werktoffwissenschaften, 7000 Stuttgart 1, Federal Republic of Germanyen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/65916/1/j.1151-2916.1986.tb04820.x.pdf
dc.identifier.doi10.1111/j.1151-2916.1986.tb04820.xen_US
dc.identifier.sourceJournal of the American Ceramic Societyen_US
dc.identifier.citedreferenceK. H. Jack, “ The Significance of Structure and Phase Equilibria in the Development of Silicon and SiAlON Ceramics,” Sci. Ceram., 11, 125 – 42 ( 1981 ).en_US
dc.identifier.citedreferenceM. H. Lewis, A. R. Bhatti, R. J. Lumby, and B. North, “ The Microstructure i Sintered SiAlON Ceramics,” J. Mater. Sci., 15, 103 – 13 ( 1980 ).en_US
dc.identifier.citedreferenceT. M. Shaw, O. Thomas, and R. E. Loeman, “ Formation and Microstructure of Mg-Si-O-N Glasses,” J. Am. Ceram. Soc., 67 [ 10 ] 643 – 47 ( 1984 ).en_US
dc.identifier.citedreferenceT. J. Headley and R. E. Loeman, “ Crystallization of a Glass-Ceramic by Epitaxiad Growth,” J. Am. Ceram. Soc., 67 [ 9 ] 620 – 25 ( 1984 ).en_US
dc.identifier.citedreferenceD. R. Clarice, N. J. Zaluzec, and R. W. Carpenter, “ The Intergranuiar Phase in Hot-Pressed Silicon Nitride: H, Evidence for Phase Separation and Crystallization ” J. Am. Ceram. Soc., 64 [ 10 ] 608 – 11 ( 1981 ).en_US
dc.identifier.citedreferenceJ. I. Goldstein, “ Principles of Thin Film X-Ray Microanalysis ” pp. 83 – 120 in Introduction to Analytical Electron Microscopy. Edited by J. J. Hren J. I. Gold Meir and D. C. Jay. Plenum Press, New York, 1979.en_US
dc.identifier.citedreferenceD. B. Williams, Practical Analytical Microscopy in Material Science; pp. 55 – 90. Phillips Electronic Instruments, Electron Optics Publishing Group, Mahwah, NJ, 1984.en_US
dc.identifier.citedreferenceK. H. Jack, “ The Relationship of Phase Diagrams to Research and Development of SiAlONs ” pp. 241 – 85 in Phase Diagrams: Materials Science and Technology, Edited by F. L. Filey. Academic Press. New York, 1978.en_US
dc.identifier.citedreferenceL. I. Gauckler, J. Weiss, T. Y. Tien, and G. Petzow, “ Insolubility of Mg in Si 3 N 4 in the System Al-Mg-Si-O-N,” J. Am. Ceram. Soc., 61 [ 9 ] 397 – 98 ( 1978 ).en_US
dc.identifier.citedreferenceI. K. Naik, L. J. Gauckler, and T. Y. Tien, “ Solid Liquid Equilibria in the System Si 3 N 4 -AIN-SiO 2 -A 2 O 3,” Am. Ceram. Soc. Bull., 61 [ 7–8 ] 332 – 35 ( 1978 ).en_US
dc.identifier.citedreferenceSteve Nunn, H. Hohnke, L. J. Gauckler, and J. Weiss, “ Subsolidus phase Relationships in Part of the System Si, Al, Mg/N, O,” Am. Ceram. Soc. Bull., 57 [ 3 ] 320 ( 1978. T. Y. Tien, G. Petzow, L. J. Gauckler, and J. Weiss “Phase Equilibrium Studies in Si 3 N 4 -Metal Oxides Systems” pp. 89–99 in Progress in Nitrogen Ceramics Edited by R. F. Riley. Mattinus Nijhoff, Boston, MA, 1983.en_US
dc.identifier.citedreferenceE. Rothman and W. Ereson, Statistics—Methods and Applications. Kendall Hunt, Dubuque, IA, 1983.en_US
dc.owningcollnameInterdisciplinary and Peer-Reviewed


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