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Axial ion charge state distribution in the vacuum arc plasma jet

dc.contributor.authorKeidar, Michaelen_US
dc.contributor.authorBrown, I. G.en_US
dc.contributor.authorBeilis, Isak I.en_US
dc.date.accessioned2010-05-06T20:35:12Z
dc.date.available2010-05-06T20:35:12Z
dc.date.issued2000-02en_US
dc.identifier.citationKeidar, M.; Brown, I. G.; Beilis, I. I. (2000). "Axial ion charge state distribution in the vacuum arc plasma jet." Review of Scientific Instruments 71(2): 698-700. <http://hdl.handle.net/2027.42/69427>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/69427
dc.description.abstractWe report on our experimental studies of the ion charge state distribution (CSD) of vacuum arc plasmas using a time-of-flight diagnostic method. The dependence of the CSD on the axial distance from the plasma source region was measured for a titanium vacuum arc. It was found that the axial CSD profile is nonuniform. Generally, the mean charge state increases approximately linearly with axial distance from about 1.7 at 12 cm up to 1.9 at 25 cm from the plasma source. A model for ion transport in the free boundary plasma jet is proposed which is based on the existence of an electric field in the quasineutral plasma. This model qualitatively explains the experimental results. © 2000 American Institute of Physics.en_US
dc.format.extent3102 bytes
dc.format.extent87587 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleAxial ion charge state distribution in the vacuum arc plasma jeten_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Aerospace Engineering, University of Michigan, Ann Arbor, Michigan 48109en_US
dc.contributor.affiliationotherLawrence Berkeley National Laboratory, University of California, Berkeley, California 94720en_US
dc.contributor.affiliationotherElectrical Discharge and Plasma Laboratory, Tel Aviv University, Tel Aviv 69978, Israelen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/69427/2/RSINAK-71-2-698-1.pdf
dc.identifier.doi10.1063/1.1150265en_US
dc.identifier.sourceReview of Scientific Instrumentsen_US
dc.identifier.citedreferenceI. G. Brown, Rev. Sci. Instrum. RSINAK65, 3061 (1994).en_US
dc.identifier.citedreferenceHandbook of Vacuum Arc Science and Technology, edited by R. L. Boxman, D. M. Sanders, and P. J. Martin (Noyes, Park Ridge, 1995).en_US
dc.identifier.citedreferenceI. G. Brown and X. Godechot, IEEE Trans. Plasma Sci. ITPSBD19, 713 (1991).en_US
dc.identifier.citedreferenceE. M. Oks, A. Anders, I. G. Brown, M. R. Dickinson, and R. A. MacGill, IEEE Trans. Plasma Sci. ITPSBD24, 1174 (1996).en_US
dc.identifier.citedreferenceE. M. Oks, I. G. Brown, M. R. Dickinson, R. A. MacGill, H. Emig, P. Spadtke, and B. H. Wolf, Appl. Phys. Lett. APPLAB67, 200 (1995).en_US
dc.identifier.citedreferenceM. Keidar, I. I. Beilis, and I. G. Brown, J. Appl. Phys. JAPIAU84, 5956 (1998).en_US
dc.identifier.citedreferenceV. M. Khoroshikh, I. I. Aksenov, and I. I. Konovalov, Sov. Phys. Tech. Phys. TEPHEX33, 723 (1998).en_US
dc.identifier.citedreferenceI. G. Brown, in The Physics and Technology of Ion Sources, edited by I. G. Brown (Wiley, New York, 1989).en_US
dc.identifier.citedreferenceI. G. Brown, J. E. Galvin, R. A. MacGill, and R. T. Wright, Rev. Sci. Instrum. RSINAK58, 1589 (1987).en_US
dc.identifier.citedreferenceI. I. Beilis and M. Zektzer, High Temp. HITEA429, 501 (1991).en_US
dc.identifier.citedreferenceM. Keidar, I. Beilis, R. L. Boxman, and S. Goldsmith, J. Phys. D: Appl. Phys. JPAPBE29, 1973 (1996).en_US
dc.identifier.citedreferenceV. M. Paskonov, in Numerical Methods in Gas Dynamics, edited by G. S. Roslyakov and L. A. Chudov (Israel Program for Scientific Translation, Jerusalem, 1966).en_US
dc.identifier.citedreferenceJ. Kutzner and H. C. Miller, J. Phys. D: Appl. Phys. JPAPBE25, 686 (1992).en_US
dc.owningcollnamePhysics, Department of


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