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Characterization of carbon nanotubes produced by arc discharge: Effect of the background pressure

dc.contributor.authorWaldorff, Erik I.en_US
dc.contributor.authorWaas, Anthony M.en_US
dc.contributor.authorFriedmann, Peretz P.en_US
dc.contributor.authorKeidar, Michaelen_US
dc.date.accessioned2010-05-06T21:17:12Z
dc.date.available2010-05-06T21:17:12Z
dc.date.issued2004-03-01en_US
dc.identifier.citationWaldorff, Erik I.; Waas, Anthony M.; Friedmann, Peretz P.; Keidar, Michael (2004). "Characterization of carbon nanotubes produced by arc discharge: Effect of the background pressure." Journal of Applied Physics 95(5): 2749-2754. <http://hdl.handle.net/2027.42/69876>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/69876
dc.description.abstractSingle walled carbon nanotubes (SWNT) produced by the anodic arc discharge over a range of constant background pressures of helium (100–1000 Torr) were examined under a high-resolution transmission electron microscope, and a Raman spectrometer. It was found that the average SWNT diameter is about 2 nm and fairly independent of the background pressure. Analysis of the relative purity of SWNTs samples suggests that highest SWNT relative concentration can be obtained at background pressure of about 200–300 Torr. Measured anode ablation rate increases linearly with background pressure. The model of the anodic arc discharge was developed. It was found that the predicted anode ablation rate agrees well with experiment suggesting that electron temperature in the anodic arc is about 0.5 eV. © 2004 American Institute of Physics.en_US
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dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleCharacterization of carbon nanotubes produced by arc discharge: Effect of the background pressureen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Aerospace Engineering, University of Michigan, Ann Arbor, Michigan 48109-2140en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/69876/2/JAPIAU-95-5-2749-1.pdf
dc.identifier.doi10.1063/1.1642737en_US
dc.identifier.sourceJournal of Applied Physicsen_US
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