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Size effects in ultrathin epitaxial ferroelectric heterostructures

dc.contributor.authorNagarajan, V.en_US
dc.contributor.authorPrasertchoung, S.en_US
dc.contributor.authorZhao, T.en_US
dc.contributor.authorZheng, H.en_US
dc.contributor.authorOuyang, J.en_US
dc.contributor.authorRamesh, Ramamoorthyen_US
dc.contributor.authorTian, Weien_US
dc.contributor.authorPan, Xiaoqingen_US
dc.contributor.authorKim, D. M.en_US
dc.contributor.authorEom, Chang-Beomen_US
dc.contributor.authorKohlstedt, H.en_US
dc.contributor.authorWaser, R.en_US
dc.date.accessioned2010-05-06T21:17:34Z
dc.date.available2010-05-06T21:17:34Z
dc.date.issued2004-06-21en_US
dc.identifier.citationNagarajan, V.; Prasertchoung, S.; Zhao, T.; Zheng, H.; Ouyang, J.; Ramesh, R.; Tian, W.; Pan, X. Q.; Kim, D. M.; Eom, C. B.; Kohlstedt, H.; Waser, R. (2004). "Size effects in ultrathin epitaxial ferroelectric heterostructures." Applied Physics Letters 84(25): 5225-5227. <http://hdl.handle.net/2027.42/69880>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/69880
dc.description.abstractIn this letter we report on the effect of thickness scaling in model PbZr0.2Ti0.8O3(PZT)/SrRuO3PbZr0.2Ti0.8O3(PZT)∕SrRuO3 heterostructures. Although theoretical models for thickness scaling have been widely reported, direct quantitative experimental data for ultrathin perovskite (<10 nm)(<10nm) films in the presence of real electrodes have still not been reported. In this letter we show a systematic quantitative experimental study of the thickness dependence of switched polarization in (001) epitaxial PZT films, 4 to 80 nm4to80nm thick. A preliminary model based on a modified Landau Ginzburg approach suggests that the nature of the electrostatics at the ferroelectric–electrode interface plays a significant role in the scaling of ferroelectric thin films.en_US
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dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleSize effects in ultrathin epitaxial ferroelectric heterostructuresen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109en_US
dc.contributor.affiliationotherMaterials Research Science and Engineering Center, University of Maryland, College Park, Maryland 20742en_US
dc.contributor.affiliationotherDepartment of Materials Science and Engineering, University of Wisconsin-Madison, Madison, Wisconsin 53706en_US
dc.contributor.affiliationotherInstitut für Festkörperforschung and CNI, Forschungzentrum Jülich, D-52425 Jülich, Germanyen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/69880/2/APPLAB-84-25-5225-1.pdf
dc.identifier.doi10.1063/1.1765742en_US
dc.identifier.sourceApplied Physics Lettersen_US
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dc.owningcollnamePhysics, Department of


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