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Electron diffraction investigation of pulsed supersonic jets

dc.contributor.authorBartell, Lawrence S.en_US
dc.contributor.authorFrench, Richard J.en_US
dc.date.accessioned2010-05-06T21:26:28Z
dc.date.available2010-05-06T21:26:28Z
dc.date.issued1989-07en_US
dc.identifier.citationBartell, Lawrence S.; French, Richard J. (1989). "Electron diffraction investigation of pulsed supersonic jets." Review of Scientific Instruments 60(7): 1223-1227. <http://hdl.handle.net/2027.42/69976>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/69976
dc.description.abstractA pulsed nozzle source has been developed for electron diffraction studies of molecular clusters. Disturbances of the electron beam by the field actuating the pulser have been reduced to a negligible magnitude by introducing magnetic shielding and by carefully timing the electron shutter. Advantages of pulsed operation in diffraction experiments with a Laval nozzle source are considerable. In the Michigan unit stagnation pressures can be increased by an order of magnitude, and pumping requirements are greatly reduced. Moreover, cleaner diffraction patterns can be obtained because exposures can be adjusted to probe a freshly developed jet before gas scattered from the walls can reach the region of sampling. Timing works so effectively that good diffraction patterns can be recorded even when the skimmer isolating the diffraction chamber from the nozzle chamber is removed. Indeed, patterns from unskimmed jets can be particularly informative when cluster beams are composed of mixed structural forms. An unorthodox ‘‘vee’’ skimmer has proven to be useful for examining narrow regions in a jet. Moreover, the vee skimmer makes it possible to measure the diffraction geometry much more precisely than has been the case with conventional skimming configurations. Pulsed operation also facilitates an accurate characterization of the density and velocity distributions in the supersonic jet. The principal design features of a pulsed apparatus are presented together with characteristic results.en_US
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dc.format.extent902874 bytes
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dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleElectron diffraction investigation of pulsed supersonic jetsen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Chemistry, University of Michigan, Ann Arbor, Michigan 48109en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/69976/2/RSINAK-60-7-1223-1.pdf
dc.identifier.doi10.1063/1.1140294en_US
dc.identifier.sourceReview of Scientific Instrumentsen_US
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dc.owningcollnamePhysics, Department of


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