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Dynamics of electron beam ablation of silicon dioxide measured by dye laser resonance absorption photography
Kovaleski, S. D.; Gilgenbach, R. M.; Ang, L. K.; Lau, Y. Y.
1998-11-02
Citation:Kovaleski, S. D.; Gilgenbach, R. M.; Ang, L. K.; Lau, Y. Y. (1998). "Dynamics of electron beam ablation of silicon dioxide measured by dye laser resonance absorption photography." Applied Physics Letters 73(18): 2576-2578. <http://hdl.handle.net/2027.42/70034>