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High resolution hard x-ray spectroscopy of femtosecond laser-produced plasmas with a CZT detector

dc.contributor.authorChen, L. M.en_US
dc.contributor.authorForget, P.en_US
dc.contributor.authorToth, R.en_US
dc.contributor.authorKieffer, Jean-Claudeen_US
dc.contributor.authorKrol, Andrzejen_US
dc.contributor.authorChamberlain, C. C.en_US
dc.contributor.authorHou, Bixueen_US
dc.contributor.authorNees, John A.en_US
dc.contributor.authorMourou, Gerard A.en_US
dc.date.accessioned2010-05-06T21:57:52Z
dc.date.available2010-05-06T21:57:52Z
dc.date.issued2003-12en_US
dc.identifier.citationChen, L. M.; Forget, P.; Toth, R.; Kieffer, J. C.; Krol, A.; Chamberlain, C. C.; Hou, B. X.; Nees, J.; Mourou, G. (2003). "High resolution hard x-ray spectroscopy of femtosecond laser-produced plasmas with a CZT detector." Review of Scientific Instruments 74(12): 5035-5038. <http://hdl.handle.net/2027.42/70312>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/70312
dc.description.abstractWe present measurement of characteristic KαKα emission from Mo, Ag, and La targets irradiated by a 60 fs, 600 mJ, 10 Hz Ti:sapphire laser pulse at 1017–1019 W/cm2.1017–1019W/cm2. These x-ray emissions can potentially be used in applications from laser-based hard x-ray sources to x-ray mammography so detailed knowledge of the spectra is required to assess imaging of the figure of merit. We show here that high resolving hard x-ray spectroscopy can be achieved, with resolving powers (E/ΔE)(E/ΔE) of 60 at 18 keV, with cadmium–zinc–telluride detection system. The KαKα conversion efficiency from the laser light to the KαKα photon was optimized thanks to this diagnostic and values as high as 2×10−52×10−5 were obtained. © 2003 American Institute of Physics.en_US
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dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleHigh resolution hard x-ray spectroscopy of femtosecond laser-produced plasmas with a CZT detectoren_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumCUOS, University of Michigan, Ann Arbor, Michigan 48109en_US
dc.contributor.affiliationotherINRS–Energie, Materiaux, Telecommunication, Varennes, Quebec J3X 1S2, Canadaen_US
dc.contributor.affiliationotherUpstate Medical University, State University of New York (SUNY), Syracuse, New York 13210en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/70312/2/RSINAK-74-12-5035-1.pdf
dc.identifier.doi10.1063/1.1628824en_US
dc.identifier.sourceReview of Scientific Instrumentsen_US
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dc.owningcollnamePhysics, Department of


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