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Appartus for high‐resolution surface tension measurement

dc.contributor.authorMagerlein, J. H.en_US
dc.contributor.authorSanders, T. M.en_US
dc.date.accessioned2010-05-06T22:13:40Z
dc.date.available2010-05-06T22:13:40Z
dc.date.issued1978-01en_US
dc.identifier.citationMagerlein, J. H.; Sanders, T. M. (1978). "Appartus for high‐resolution surface tension measurement." Review of Scientific Instruments 49(1): 94-100. <http://hdl.handle.net/2027.42/70480>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/70480
dc.identifier.urihttp://www.ncbi.nlm.nih.gov/sites/entrez?cmd=retrieve&db=pubmed&list_uids=18698948&dopt=citationen_US
dc.description.abstractWe describe an apparatus for measuring surface tension of insulating liquids by capacitive sensing of capillary rise. Two guarded coaxial capacitors with different gap widths are connected to permit liquid to flow between them. The higher capillary rise in the narrow‐gap capacitor is balanced by a dc voltage applied to the wide capacitor by a servosystem. In a measurements of the surface tension of liquid helium we obtain a resolution of 1 part in 105. The technique is well suited for automated measurements of small changes in surface tension.en_US
dc.format.extent3102 bytes
dc.format.extent640319 bytes
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleAppartus for high‐resolution surface tension measurementen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Physics, University of Michigan, Ann Arbor, Michigan 48104en_US
dc.identifier.pmid18698948en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/70480/2/RSINAK-49-1-94-1.pdf
dc.identifier.doi10.1063/1.1135263en_US
dc.identifier.sourceReview of Scientific Instrumentsen_US
dc.identifier.citedreferenceN. K. Adam, The Physics and Chemistry of Surfaces (Oxford U.P., London, 1941), 3rd ed.; J. T. Davies and E. K. Rideal, Interfacial Phenomena (Academic, New York, 1963), 2nd ed.en_US
dc.identifier.citedreferenceD. P. E. Dickson, D. Caroline, and E. Mendoza, Phys. Lett. A 33, 139 (1970).en_US
dc.identifier.citedreferenceF. M. Gasparini, J. Eckardt, D. O. Edwards, and S. Y. Shen, J. Low Temp. Phys. 13, 437 (1973); J. R. Eckardt, Ph.D. thesis (Ohio State University, 1973) (available from University Microfilms, Ann Arbor, MI).en_US
dc.identifier.citedreferenceJ. H. Magerlein and T. M. Sanders, Jr., Phys. Rev. Lett. 36, 258 (1976).en_US
dc.identifier.citedreferenceJ. H. Magerlein, Ph.D. thesis (University of Michigan, 1975) (available from University Microfilms, Ann Arbor, MI).en_US
dc.identifier.citedreferenceJ. D. Jackson, Classical Electrodynamics (Wiley, New York, 1962), pp. 126–127.en_US
dc.identifier.citedreferenceSinger Instrumentation, 3211 South La Cienega Blvd., Los Angeles, CA 90016.en_US
dc.identifier.citedreferenceJ. H. Magerlein and T. M. Sanders, Jr., Rev. Sci. Instrum. 46, 1653 (1975).en_US
dc.identifier.citedreferenceEmerson and Cuming, Canton, MA 02021.en_US
dc.identifier.citedreferenceType UT‐20, Uniform Tubes, Collegeville, PA 19426.en_US
dc.identifier.citedreferenceC. T. Van Degrift, Ph.D. thesis (University of California, Irvine, 1974) (available from University Microfilms, Ann Arbor, MI).en_US
dc.identifier.citedreferenceW. E. Keller, Phys. Rev. 97, 1 (1955).en_US
dc.identifier.citedreferenceK. R. Atkins and Y. Narahara, Phys. Rev. A 138, 437 (1965).en_US
dc.owningcollnamePhysics, Department of


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