Monte Carlo Simulation of the Low‐Voltage Arc Mode in Plasma Diodes
dc.contributor.author | Salinger, S. N. | en_US |
dc.contributor.author | Rowe, J. E. (Joseph Everett) | en_US |
dc.date.accessioned | 2010-05-06T22:15:55Z | |
dc.date.available | 2010-05-06T22:15:55Z | |
dc.date.issued | 1968-07 | en_US |
dc.identifier.citation | Salinger, S. N.; Rowe, J. E. (1968). "Monte Carlo Simulation of the Low‐Voltage Arc Mode in Plasma Diodes." Journal of Applied Physics 39(8): 3933-3944. <http://hdl.handle.net/2027.42/70504> | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/70504 | |
dc.description.abstract | A statistical simulation of the low‐voltage arc mode of plasma diodes is carried out on a large‐scale digital computer to ascertain the importance of various thermalization and transport mechanisms. The computer experiment is two‐dimensional and utilizes Monte Carlo techniques to study the low‐voltage arc in neon at p=2 Torr, current=4 A, and diode spacing=2.37 cm. Results on the potential distribution, electron‐density distribution, and electron‐energy density function are presented and discussed. The theoretical results are correlated with experimental results. | en_US |
dc.format.extent | 3102 bytes | |
dc.format.extent | 1090501 bytes | |
dc.format.mimetype | text/plain | |
dc.format.mimetype | application/pdf | |
dc.publisher | The American Institute of Physics | en_US |
dc.rights | © The American Institute of Physics | en_US |
dc.title | Monte Carlo Simulation of the Low‐Voltage Arc Mode in Plasma Diodes | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Electron Physics Laboratory, Department of Electrical Engineering, The University of Michigan, Ann Arbor, Michigan | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/70504/2/JAPIAU-39-8-3933-1.pdf | |
dc.identifier.doi | 10.1063/1.1656878 | en_US |
dc.identifier.source | Journal of Applied Physics | en_US |
dc.identifier.citedreference | S. N. Salinger, Tech. Rept. No. 99, Contr. No. DA‐36‐039 AMC‐02269(E), Electron Physics Laboratory, The University of Michigan, Ann Arbor (March 1967). | en_US |
dc.identifier.citedreference | R. H. Bullis et al., J. Appl. Phys. 38, 3425 (1967). | en_US |
dc.identifier.citedreference | P. Burger, J. Appl. Phys. 36, 1938 (1965). | en_US |
dc.identifier.citedreference | J. E. Rowe and R. J. Lomax, Proceedings of the 25th Annual Conference on Phys. Electronics (Technology Press, Cambridge, Mass., 1965), pp. 109–120. | en_US |
dc.identifier.citedreference | C. M. Goldstein, in Proceedings of the Thermionic Conversion Specialist Conference, Cleveland, Ohio (1964), pp. 188–197. | en_US |
dc.identifier.citedreference | P. Burger, in Proceedings of the Thermionic Conversion Specialist Conference, San Diego, Calif. (1965), pp. 65–68. | en_US |
dc.identifier.citedreference | R. W. Hockney, Rept. No. SU‐SEL‐64‐056, Stanford Electronics Laboratories, Stanford University, Stanford, Calif. (May 1964). | en_US |
dc.identifier.citedreference | R. P. Wadhwa and G. Kooyers, Rept. No. NASA CR‐54033, Electron Tube Division, Litton Industries, San Carlos, Calif. (1964), pp. 87–104. | en_US |
dc.identifier.citedreference | R. J. Martin, Tech. Rept. No. 101, Contr. No. DA‐36‐039 AMC‐02269(E), Electron Physics Laboratory, The University of Michigan, Ann Arbor (June 1967). | en_US |
dc.identifier.citedreference | E. W. McDaniel, Collision Phenomena in Ionized Gases (John Wiley & Sons, Inc., New York, 1964), p. 437. | en_US |
dc.identifier.citedreference | L. S. Frost, Phys. Rev. 105, 354 (1957). | en_US |
dc.identifier.citedreference | S. Chandrasekhar, Rev. Mod. Phys. 15, 1 (1943). | en_US |
dc.owningcollname | Physics, Department of |
Files in this item
Remediation of Harmful Language
The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.
Accessibility
If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.