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Microwave measurements of the intensity distribution of echelette diffraction gratings : report no. 2 ; February to August 1953.

dc.contributor.authorPeters, C. W.en_US
dc.contributor.authorDeibel, P. V.en_US
dc.contributor.authorHunt, Robert Henryen_US
dc.contributor.authorPursley, William Knox.en_US
dc.contributor.authorZipf, Theodore Francis.en_US
dc.date.accessioned2006-02-03
dc.date.available2006-02-03
dc.date.issued1954en_US
dc.identifierUMR3145en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/7055
dc.format.extent14 bytes
dc.format.extent16110 bytes
dc.format.extent3366 bytes
dc.format.extent19304 bytes
dc.format.extent2214909 bytes
dc.format.mimetypetext/plain
dc.format.mimetypetext/plain
dc.format.mimetypetext/plain
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.language.isoen_USen_US
dc.subjectDiffraction gratings.en_US
dc.titleMicrowave measurements of the intensity distribution of echelette diffraction gratings : report no. 2 ; February to August 1953.en_US
dc.typeTechnical Reporten_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/7055/5/bad0860.0002.001.pdfen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/7055/4/bad0860.0002.001.txten_US
dc.owningcollnameEngineering, College of - Technical Reports


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