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The design of an atmospheric pressure ionization/time‐of‐flight mass spectrometer using a beam deflection method

dc.contributor.authorMa, Ceen_US
dc.contributor.authorMichael, Steven M.en_US
dc.contributor.authorChien, Mingtaen_US
dc.contributor.authorZhu, Jianzhongen_US
dc.contributor.authorLubman, David M.en_US
dc.date.accessioned2010-05-06T22:40:10Z
dc.date.available2010-05-06T22:40:10Z
dc.date.issued1992-01en_US
dc.identifier.citationMa, Ce; Michael, Steven M.; Chien, Mingta; Zhu, Jianzhong; Lubman, David M. (1992). "The design of an atmospheric pressure ionization/time‐of‐flight mass spectrometer using a beam deflection method." Review of Scientific Instruments 63(1): 139-148. <http://hdl.handle.net/2027.42/70760>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/70760
dc.description.abstractA novel time‐of‐flight (TOF) mass spectrometer configuration has been designed which can be interfaced to a continuous ion beam source produced by atmospheric pressure ionization. The TOF device uses a beam deflection method to sweep the ion beam past a slit placed near the ionization source in order to generate a start pulse for TOF detection. The beam sweep technique is modeled by computer simulation and optimized for the various experimental parameters. Nonvolatile samples are injected into the TOF device using liquid injection into a glow discharge atmospheric pressure ionization source in helium. A resolution of at least 519 at m/z 311 is obtained, which is limited by the experimental parameters available in our experiment. The mass resolution is computer modeled and it is shown that as the mass increases, the experimental constraints become less important, and the resolution will increase. It is predicted that using the correct experimental conditions and with the addition of an ion reflector that resolution of well over 1000 should be obtained.en_US
dc.format.extent3102 bytes
dc.format.extent1371574 bytes
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dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleThe design of an atmospheric pressure ionization/time‐of‐flight mass spectrometer using a beam deflection methoden_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Chemistry, University of Michigan, Ann Arbor, Michigan 48109en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/70760/2/RSINAK-63-1-139-1.pdf
dc.identifier.doi10.1063/1.1143027en_US
dc.identifier.sourceReview of Scientific Instrumentsen_US
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dc.owningcollnamePhysics, Department of


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