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Evidence of interdot electronic tunneling in vertically coupled In0.4Ga0.6AsIn0.4Ga0.6As self-organized quantum dots

dc.contributor.authorUrayama, J.en_US
dc.contributor.authorNorris, Theodore B.en_US
dc.contributor.authorKochman, Boazen_US
dc.contributor.authorSingh, J.en_US
dc.contributor.authorBhattacharya, Pallab K.en_US
dc.date.accessioned2010-05-06T23:00:24Z
dc.date.available2010-05-06T23:00:24Z
dc.date.issued2000-04-24en_US
dc.identifier.citationUrayama, J.; Norris, T. B.; Kochman, B.; Singh, J.; Bhattacharya, P. (2000). "Evidence of interdot electronic tunneling in vertically coupled In0.4Ga0.6AsIn0.4Ga0.6As self-organized quantum dots." Applied Physics Letters 76(17): 2394-2396. <http://hdl.handle.net/2027.42/70974>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/70974
dc.description.abstractUltrafast differential transmission spectroscopy with a resonant pump reveals evidence of electronic tunneling among the excited levels of vertically aligned In0.4Ga0.6AsIn0.4Ga0.6As self-organized quantum dots. This evidence of tunneling is observed as a rapid spectral redistribution of electrons within a few hundred femtoseconds of optical excitation. Measurements show that this spectral spread is independent of carrier density and, therefore, indicate that carrier–carrier scattering is not the main mechanism for carrier redistribution. Instead, electronic tunneling is responsible for the interdot coupling; tunneling rate calculations agree reasonably with the experiment, supporting this conclusion. © 2000 American Institute of Physics.en_US
dc.format.extent3102 bytes
dc.format.extent46124 bytes
dc.format.mimetypetext/plain
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dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleEvidence of interdot electronic tunneling in vertically coupled In0.4Ga0.6AsIn0.4Ga0.6As self-organized quantum dotsen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumCenter for Ultrafast Optical Science, The University of Michigan, Ann Arbor, Michigan 48109-2099en_US
dc.contributor.affiliationumSolid State Electronics Laboratory, Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, Michigan 48109-2122en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/70974/2/APPLAB-76-17-2394-1.pdf
dc.identifier.doi10.1063/1.126356en_US
dc.identifier.sourceApplied Physics Lettersen_US
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dc.owningcollnamePhysics, Department of


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