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Further studies of transistor measurement techniques at high frequencies : progress report 2

dc.contributor.authorShaler, P. M.en_US
dc.contributor.authorSpencer, Nelson W.en_US
dc.date.accessioned2006-02-03T18:59:05Z
dc.date.available2006-02-03T18:59:05Z
dc.date.issued1958en_US
dc.identifierUMR3560en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/7548
dc.format.extent11 bytes
dc.format.extent9547 bytes
dc.format.extent3366 bytes
dc.format.extent11822 bytes
dc.format.extent568637 bytes
dc.format.mimetypetext/plain
dc.format.mimetypetext/plain
dc.format.mimetypetext/plain
dc.format.mimetypetext/plain
dc.format.mimetypeapplication/pdf
dc.language.isoen_USen_US
dc.subjectTransistors -- Research.en_US
dc.subjectSemiconductors -- Research.en_US
dc.titleFurther studies of transistor measurement techniques at high frequencies : progress report 2en_US
dc.typeTechnical Reporten_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/7548/5/bad2055.0001.001.pdfen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/7548/4/bad2055.0001.001.txten_US
dc.owningcollnameEngineering, College of - Technical Reports


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