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Mean and Variance of Photon Counting with Deadtime

dc.contributor.authorYu, Daniel F.en_US
dc.contributor.authorFessler, Jeffrey A.en_US
dc.date.accessioned2011-08-18T18:20:48Z
dc.date.available2011-08-18T18:20:48Z
dc.date.issued1999-10-24en_US
dc.identifier.citationYu, D.F.; Fessler, J.A. (1999). "Mean and Variance of Photon Counting with Deadtime." IEEE Conference Record of Nuclear Science Symposium 3: 1470-1474. <http://hdl.handle.net/2027.42/85820>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/85820
dc.description.abstractThe statistics of photon counting by systems affected by deadtime are potentially important for statistical image reconstruction methods. We present a new way of analyzing the moments of the counting process for a counter system affected by various models of deadtime related to PET and SPECT imaging. We derive simple and exact expressions for the first and second moments of the number of recorded events under various models. From our mean expression for a SPECT deadtime model, we derive a simple estimator for the actual intensity of the underlying Poisson process; simulations show that our estimator is unbiased even for extremely high count rates.en_US
dc.publisherIEEEen_US
dc.titleMean and Variance of Photon Counting with Deadtimeen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelBiomedical Engineeringen_US
dc.subject.hlbtoplevelEngineeringen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDept. of EECS.en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/85820/1/Fessler158.pdf
dc.identifier.doi10.1109/NSSMIC.1999.842836en_US
dc.identifier.sourceIEEE Conference Record of Nuclear Science Symposiumen_US
dc.owningcollnameElectrical Engineering and Computer Science, Department of (EECS)


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