Bias-Variance Trade-offs Analysis Using Uniform CR Bound for Images

Usman, Mohammad; Hero, Alfred O. III; Fessler, Jeffrey A.

Bias-Variance Trade-offs Analysis Using Uniform CR Bound for Images

dc.contributor.author	Usman, Mohammad	en_US
dc.contributor.author	Hero, Alfred O. III	en_US
dc.contributor.author	Fessler, Jeffrey A.	en_US
dc.date.accessioned	2011-08-18T18:21:14Z
dc.date.available	2011-08-18T18:21:14Z
dc.date.issued	1994-11-13	en_US
dc.identifier.citation	Usman, M.; Hero, A.O. III; Fessler, J.A. (1994). "Bias-Variance Trade-offs Analysis Using Uniform CR Bound for Images." IEEE International Conference on Image Processing 2: 835-839. <http://hdl.handle.net/2027.42/85969>	en_US
dc.identifier.uri	https://hdl.handle.net/2027.42/85969
dc.description.abstract	We apply a uniform Cramer-Rao (CR) bound to study the bias-variance trade-offs in parameter estimation. The uniform CR bound is used to specify achievable and unachievable regions in the bias-variance trade-off plane. The applications considered are: (1) two-dimensional single photon emission computed tomography (SPECT) system, and (2) one dimensional edge localization.	en_US
dc.publisher	IEEE	en_US
dc.title	Bias-Variance Trade-offs Analysis Using Uniform CR Bound for Images	en_US
dc.type	Article	en_US
dc.subject.hlbsecondlevel	Biomedical Engineering	en_US
dc.subject.hlbtoplevel	Engineering	en_US
dc.description.peerreviewed	Peer Reviewed	en_US
dc.description.bitstreamurl	http://deepblue.lib.umich.edu/bitstream/2027.42/85969/1/Fessler131.pdf
dc.identifier.doi	10.1109/ICIP.1994.413688	en_US
dc.identifier.source	IEEE International Conference on Image Processing	en_US
dc.owningcollname	Electrical Engineering and Computer Science, Department of (EECS)

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