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Enhanced nonradiative relaxation and photoluminescence quenching in random, doped nanocrystalline powders

dc.contributor.authorRuan, X. L.en_US
dc.contributor.authorKaviany, Massouden_US
dc.date.accessioned2011-11-15T16:03:20Z
dc.date.available2011-11-15T16:03:20Z
dc.date.issued2005-05-15en_US
dc.identifier.citationRuan, X. L.; Kaviany, M. (2005). "Enhanced nonradiative relaxation and photoluminescence quenching in random, doped nanocrystalline powders." Journal of Applied Physics 97(10): 104331-104331-8. <http://hdl.handle.net/2027.42/87544>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/87544
dc.description.abstractNonradiative relaxation and photoluminescence quenching in nanocrystalline powders doped with rare-earth elements are of interest in optical bistability, random laser, and other optoelectronic applications. Here, the luminescence quenching of a one-dimensional random medium made of multilayer nanoparticles (Y2O3)(Y2O3) doped with rare-earth elements (Yb3+)(Yb3+) is analyzed by considering the transport, transition, and interaction of the fundamental energy carriers. The nonradiative decay and luminescence quenching in random media are enhanced compared to single crystals, due to multiple scattering, enhanced absorption, and low thermal conductivity. The coherent wave treatment is used to calculate the photon absorption, allowing for field enhancement and photon localization. The luminescent and thermal emission is considered as incoherent. The size-dependent absorption coefficient and penetration depth are observed. The nonradiative decay is identified as a multiphonon relaxation process, and is found to be enhanced compared to bulk materials. The luminescence quenching and nonlinear thermal emission, occurring with increasing irradiation intensity, are predicted.en_US
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleEnhanced nonradiative relaxation and photoluminescence quenching in random, doped nanocrystalline powdersen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Mechanical Engineering, University of Michigan, Ann Arbor, Michigan 48109-2125en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/87544/2/104331_1.pdf
dc.identifier.doi10.1063/1.1900937en_US
dc.identifier.sourceJournal of Applied Physicsen_US
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dc.owningcollnamePhysics, Department of


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