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Organic light emitting devices with enhanced outcoupling via microlenses fabricated by imprint lithography

dc.contributor.authorSun, Yiruen_US
dc.contributor.authorForrest, Stephen R.en_US
dc.date.accessioned2011-11-15T16:07:46Z
dc.date.available2011-11-15T16:07:46Z
dc.date.issued2006-10-01en_US
dc.identifier.citationSun, Yiru; Forrest, Stephen R. (2006). "Organic light emitting devices with enhanced outcoupling via microlenses fabricated by imprint lithography." Journal of Applied Physics 100(7): 073106-073106-6. <http://hdl.handle.net/2027.42/87744>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/87744
dc.description.abstractHigh efficiency white organic light emitting devices (WOLEDs) with optical outcoupling enhanced by hexagonal polymethylmethacrylate microlens arrays fabricated by imprint lithography on a glass substrate are demonstrated. Monte Carlo and finite difference time domain simulations of the emitted light are used to optimize the microlens design. The measured enhancement of light outcoupling and the angular dependence of the extracted light intensity are in agreement with the simulation. Using microlens arrays, we demonstrate a fluorescent/phosphorescent WOLED with a maximum external quantum efficiency of (14.3±0.3)%(14.3±0.3)% at 900 cd/m2900cd∕m2 and power efficiency of 21.6±0.5 lm/W21.6±0.5lm∕W at 220 cd/m2220cd∕m2. The electroluminescent spectra at viewing angles from normal to the substrate plane, to 60° off normal, remain almost unchanged, giving a color rendering index of 87.en_US
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleOrganic light emitting devices with enhanced outcoupling via microlenses fabricated by imprint lithographyen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Electrical Engineering and Computer Science, University of Michigan, Ann Arbor, Michigan 48109; Department of Applied Physics, University of Michigan, Ann Arbor, Michigan 48109; and Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109en_US
dc.contributor.affiliationotherPrinceton Institute for the Science and Technology of Materials (PRISM), Princeton University, Princeton, New Jersey 08544 and Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544en_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/87744/2/073106_1.pdf
dc.identifier.doi10.1063/1.2356904en_US
dc.identifier.sourceJournal of Applied Physicsen_US
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dc.owningcollnamePhysics, Department of


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