Show simple item record

Substitution-induced phase transition and enhanced multiferroic properties of Bi1−xLaxFeO3Bi1−xLaxFeO3 ceramics

dc.contributor.authorZhang, Shan-Taoen_US
dc.contributor.authorZhang, Yien_US
dc.contributor.authorLu, Ming-Huien_US
dc.contributor.authorDu, Chao-Lingen_US
dc.contributor.authorChen, Yan-Fengen_US
dc.contributor.authorLiu, Zhi-Guoen_US
dc.contributor.authorZhu, Yong-Yuanen_US
dc.contributor.authorMing, Nai-Benen_US
dc.contributor.authorPan, Xiaoqingen_US
dc.date.accessioned2011-11-15T16:08:23Z
dc.date.available2011-11-15T16:08:23Z
dc.date.issued2006-04-17en_US
dc.identifier.citationZhang, Shan-Tao; Zhang, Yi; Lu, Ming-Hui; Du, Chao-Ling; Chen, Yan-Feng; Liu, Zhi-Guo; Zhu, Yong-Yuan; Ming, Nai-Ben; Pan, X. Q. (2006). "Substitution-induced phase transition and enhanced multiferroic properties of Bi1−xLaxFeO3Bi1−xLaxFeO3 ceramics." Applied Physics Letters 88(16): 162901-162901-3. <http://hdl.handle.net/2027.42/87773>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/87773
dc.description.abstractSingle-phase, insulating Bi1−xLaxFeO3Bi1−xLaxFeO3 (BLFOx, x = 0.05x=0.05, 0.10, 0.15, 0.20, 0.30, and 0.40) ceramics were prepared. An obvious phase transition from rhombohedral to orthorhombic phase was observed near x = 0.30x=0.30. It is found that the phase transition destructs the spin cycloid of BiFeO3BiFeO3 (BFO), and therefore, releases the locked magnetization and enhances magnetoelectric interaction. As a result, improved multiferroic properties of the BLFO0.30 ceramics with remnant polarization and magnetization (2Pr2Pr and 2Mr2Mr) of 22.4 μC/cm222.4μC∕cm2 and 0.041 emu/g0.041emu∕g, respectively, were established.en_US
dc.publisherThe American Institute of Physicsen_US
dc.rights© The American Institute of Physicsen_US
dc.titleSubstitution-induced phase transition and enhanced multiferroic properties of Bi1−xLaxFeO3Bi1−xLaxFeO3 ceramicsen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.contributor.affiliationumDepartment of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109-2136en_US
dc.contributor.affiliationotherNational Laboratory of Solid State Microstructures and Department of Materials Science and Engineering, Nanjing University, Nanjing 210093, People’s Republic of Chinaen_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/87773/2/162901_1.pdf
dc.identifier.doi10.1063/1.2195927en_US
dc.identifier.sourceApplied Physics Lettersen_US
dc.identifier.citedreferenceJ. Wang, J. B. Neaton, H. Zheng, V. Nagarajan, S. B. Ogale, B. Liu, D. Viehland, V. Vaithyanathan, D. G. Schlom, U. V. Waghmare, N. A. Spaldin, K. M. Rabe, M. Wuttig, and R. Ramesh, Science 299, 1719 (2003).en_US
dc.identifier.citedreferenceK. Y. Yun, M. Noda, M. Okuyama, H. Saeki, H. Tabata, and K. Saito, J. Appl. Phys. 96, 3399 (2004).en_US
dc.identifier.citedreferenceJ. Li, J. Wang, M. Wuttig, R. Ramesh, N. G. Wang, B. Ruette, A. P. Pyatakov, A. K. Zvezdin, and D. Viehland, Appl. Phys. Lett. 84, 5261 (2004).en_US
dc.identifier.citedreferenceF. Bai, J. Wang, M. Wuttig, J. Li, N. Wang, A. P. Pyatakov, A. K. Zvezdin, L. E. Cross, and D. Viehland, Appl. Phys. Lett. 86, 032511 (2005).en_US
dc.identifier.citedreferenceG. Xu, H. Hiraka, G. Shirane, J. Li, J. Wang, and D. Viehland, Appl. Phys. Lett. 86, 182905 (2005).en_US
dc.identifier.citedreferenceM. M. Kumar, V. R. Palkar, K. Srinivas, and S. V. Suryanarayana, Appl. Phys. Lett. 76, 2764 (2000).en_US
dc.identifier.citedreferenceY. P. Wang, L. Zhou, M. F. Zhang, X. Y. Chen, J. M. Liu, and Z. G. Liu, Appl. Phys. Lett. 84, 1731 (2004).en_US
dc.identifier.citedreferenceA. K. Pradhan, K. Zhang, D. Hunter, J. B. Dadson, G. B. Loutts, P. Bhattacharya, R. Katiyar, J. Zhang, and D. J. Sellmyer, J. Appl. Phys. 97, 093903 (2005).en_US
dc.identifier.citedreferenceS. Iakovlev, C.-H. Solterbeck, M. Kuhnke, and M. Es-Souni, J. Appl. Phys. 97, 094901 (2005).en_US
dc.identifier.citedreferenceW. Eerenstein, F. D. Morrison, J. Dho, M. G. Blamire, J. F. Scott, and N. D. Mathur, Science 307, 1203a (2005).en_US
dc.identifier.citedreferenceC. Ederer and N. A. Spaldin, Phys. Rev. B 71, 060401(R) (2005).en_US
dc.identifier.citedreferenceI. Sosnowska, T. Peterlin-Neumaier, and E. Steichele, J. Phys. C 15, 4835 (1982).en_US
dc.identifier.citedreferenceB. Ruette, S. Zvyagin, A. P. Pyatakov, A. A. Bush, J. F. Li, V. I. Belotelov, A. K. Zvezdin, and D. Viehland, Phys. Rev. B 69, 064114 (2004).en_US
dc.identifier.citedreferenceYu. F. Popov, A. M. Kadomtseva, S. S. Drotov, D. V. Belov, G. P. Worob’ev, P. N. Makhov, and A. K. Zvezdin, Low Temp. Phys. 27, 478 (2001).en_US
dc.identifier.citedreferenceI. Sosnowska, W. Schäfer, W. Kockelmann, K. H. Andersen, and I. O. Troyanchuk, Appl. Phys. A: Mater. Sci. Process. 74, S1040 (2002).en_US
dc.identifier.citedreferenceA. V. Zalesskii, A. A. Frolov, T. A. Khimich, and A. A. Bush, Phys. Solid State 45, 141 (2003).en_US
dc.identifier.citedreferenceA. V. Zalesskii, A. K. Zvezdin, A. A. Frolov, and A. A Bush, JETP Lett. 71, 465 (2000).en_US
dc.identifier.citedreferenceJ. S. Kim, C. I. Cheon, C. H. Lee, and P. W. Jang, J. Appl. Phys. 96, 468 (2004).en_US
dc.identifier.citedreferenceJ. S. Kim, C. I. Cheon, Y. N. Choi, and P. W. Jang, J. Appl. Phys. 93, 9263 (2003).en_US
dc.identifier.citedreferenceJ. R. Cheng, N. Li, and L. E. Cross, J. Appl. Phys. 94, 5153 (2003).en_US
dc.identifier.citedreferenceN. Wang, J. Cheng, A. Pyatakov, A. K. Zvezdin, J. F. Li, L. E. Cross, and D. Viehland, Phys. Rev. B 72, 104434 (2005).en_US
dc.identifier.citedreferenceJ. Lüning, F. Nolting, A. Scholl, H. Ohldag, J. W. Seo, J. Fompeyrine, J.-P. Locquet, and J. Stöhr, Phys. Rev. B 67, 214433 (2003).en_US
dc.identifier.citedreferenceD. Lee, M. G. Kim, S. Ryu, H. M. Jang, and S. G. Lee, Appl. Phys. Lett. 86, 222903 (2005).en_US
dc.identifier.citedreferenceZ. V. Gabbasova, M. D. Kuz’min, A. K. Zvezdin, I. S. Dubenko, V. A. Murashov, D. N. Rakov, and I. B. Krynetsky, Phys. Lett. A 158, 491 (1991).en_US
dc.identifier.citedreferenceM. Popa, J. Frantti, and M. Kakihana, Solid State Ionics 154, 135 (2002).en_US
dc.identifier.citedreferenceJ. Yu, N. Koshikawa, Y. Arai, S. Yoda, and H. Saitou, J. Cryst. Growth 231, 568 (2001).en_US
dc.owningcollnamePhysics, Department of


Files in this item

Show simple item record

Remediation of Harmful Language

The University of Michigan Library aims to describe library materials in a way that respects the people and communities who create, use, and are represented in our collections. Report harmful or offensive language in catalog records, finding aids, or elsewhere in our collections anonymously through our metadata feedback form. More information at Remediation of Harmful Language.

Accessibility

If you are unable to use this file in its current format, please select the Contact Us link and we can modify it to make it more accessible to you.