Structural and transport properties of epitaxial NaxCoO2NaxCoO2 thin films
dc.contributor.author | Venimadhav, A. | en_US |
dc.contributor.author | Soukiassian, A. | en_US |
dc.contributor.author | Tenne, D. A. | en_US |
dc.contributor.author | Li, Qi | en_US |
dc.contributor.author | Xi, X. X. | en_US |
dc.contributor.author | Schlom, Darrell G. | en_US |
dc.contributor.author | Arroyave, R. | en_US |
dc.contributor.author | Liu, Zi-Kui | en_US |
dc.contributor.author | Sun, H. P. | en_US |
dc.contributor.author | Pan, Xiaoqing | en_US |
dc.contributor.author | Lee, Minhyea | en_US |
dc.contributor.author | Ong, N. P. | en_US |
dc.date.accessioned | 2011-11-15T16:09:33Z | |
dc.date.available | 2011-11-15T16:09:33Z | |
dc.date.issued | 2005-10-24 | en_US |
dc.identifier.citation | Venimadhav, A.; Soukiassian, A.; Tenne, D. A.; Li, Qi; Xi, X. X.; Schlom, D. G.; Arroyave, R.; Liu, Z. K.; Sun, H. P.; Pan, Xiaoqing; Lee, Minhyea; Ong, N. P. (2005). "Structural and transport properties of epitaxial NaxCoO2NaxCoO2 thin films." Applied Physics Letters 87(17): 172104-172104-3. <http://hdl.handle.net/2027.42/87829> | en_US |
dc.identifier.uri | https://hdl.handle.net/2027.42/87829 | |
dc.description.abstract | We have studied structural and transport properties of epitaxial NaxCoO2NaxCoO2 thin films on (0001) sapphire substrate prepared by topotaxially converting an epitaxial Co3O4Co3O4 film to NaxCoO2NaxCoO2 with annealing in Na vapor. The films are cc-axis oriented and in-plane aligned with [100]NaxCoO2[101¯0]NaxCoO2 rotated by 30° from [100][101¯0] sapphire. Different Na vapor pressures during the annealing resulted in films with different Na concentrations, which showed distinct transport properties. | en_US |
dc.publisher | The American Institute of Physics | en_US |
dc.rights | © The American Institute of Physics | en_US |
dc.title | Structural and transport properties of epitaxial NaxCoO2NaxCoO2 thin films | en_US |
dc.type | Article | en_US |
dc.subject.hlbsecondlevel | Physics | en_US |
dc.subject.hlbtoplevel | Science | en_US |
dc.description.peerreviewed | Peer Reviewed | en_US |
dc.contributor.affiliationum | Department of Materials Science and Engineering, The University of Michigan, Ann Arbor, Michigan 48109 | en_US |
dc.contributor.affiliationother | Department of Physics, The Pennsylvania State University, University Park, Pennsylvania 16802 | en_US |
dc.contributor.affiliationother | Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802 | en_US |
dc.contributor.affiliationother | Department of Physics, The Pennsylvania State University, University Park, Pennsylvania 16802 | en_US |
dc.contributor.affiliationother | Department of Physics and Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802 | en_US |
dc.contributor.affiliationother | Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16802 | en_US |
dc.contributor.affiliationother | Department of Physics, Princeton University, New Jersey 08544 | en_US |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/87829/2/172104_1.pdf | |
dc.identifier.doi | 10.1063/1.2117619 | en_US |
dc.identifier.source | Applied Physics Letters | en_US |
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dc.owningcollname | Physics, Department of |
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