4.5: 200 dpi 4‐a‐Si:H TFTs Current‐Driven AM‐PLEDs

Hong, Yongtaek; Nahm, Jeong‐yup; Kanicki, Jerzy

4.5: 200 dpi 4‐a‐Si:H TFTs Current‐Driven AM‐PLEDs

dc.contributor.author	Hong, Yongtaek	en_US
dc.contributor.author	Nahm, Jeong‐yup	en_US
dc.contributor.author	Kanicki, Jerzy	en_US
dc.date.accessioned	2012-07-12T17:23:39Z
dc.date.available	2012-07-12T17:23:39Z
dc.date.issued	2003-05	en_US
dc.identifier.citation	Hong, Yongtaek; Nahm, Jeong‐yup ; Kanicki, Jerzy (2003). "4.5: 200 dpi 4â aâ Si:H TFTs Currentâ Driven AMâ PLEDs." SID Symposium Digest of Technical Papers 34(1). <http://hdl.handle.net/2027.42/92048>	en_US
dc.identifier.issn	0097-966X	en_US
dc.identifier.issn	2168-0159	en_US
dc.identifier.uri	https://hdl.handle.net/2027.42/92048
dc.description.abstract	In this paper, for the first time, we report 200 dpi current‐driven active‐matrix organic polymer light‐emitting displays based on five‐terminal, four amorphous silicon thin‐film transistors TFTs pixel electrode circuits, which compensate for the threshold voltage shift of organic polymer light‐emitting devices and TFTs.	en_US
dc.publisher	Blackwell Publishing Ltd	en_US
dc.publisher	Wiley Periodicals, Inc.	en_US
dc.title	4.5: 200 dpi 4‐a‐Si:H TFTs Current‐Driven AM‐PLEDs	en_US
dc.type	Article	en_US
dc.rights.robots	IndexNoFollow	en_US
dc.subject.hlbsecondlevel	Electrical Engineering	en_US
dc.subject.hlbtoplevel	Engineering	en_US
dc.description.peerreviewed	Peer Reviewed	en_US
dc.contributor.affiliationum	Solid‐State Electronics Lab., Dept. of EECS, The University of Michigan, Ann Arbor, MI	en_US
dc.description.bitstreamurl	http://deepblue.lib.umich.edu/bitstream/2027.42/92048/1/1.1832197.pdf
dc.identifier.doi	10.1889/1.1832197	en_US
dc.identifier.source	SID Symposium Digest of Technical Papers	en_US
dc.identifier.citedreference	Shimoda, T., Kimura, M., and Miyashita S., Proc. of IEDM, 107 ( 1999 ).	en_US
dc.identifier.citedreference	Dawson, R.M. A., Shen, S., Furst, D.A., Connor, S., Hsu, J., Kane, M.G., Stewart, R.G., Ipri, A., King, C.N., Green, P.J., Flegal, R.T., Pearson, S., Barrow, W.A., Dickey, E., Ping, K., Robinson, S., Tang, C.W., Van Slyke, S., Chen, F., Shi, J., Lu, M.H., Moskewicz, M., and Sturm, J.C., Proc. of SID Sym., 438 ( 1999 ).	en_US
dc.identifier.citedreference	Hong, Y. and Kanicki, J., Proc. of Asia Display, 1443 ( 2001 ).	en_US
dc.identifier.citedreference	Kanicki, J., Kim, J‐H, Nahm, J‐Y, He, Y., and Hattori, R., Proc. of Asia Display, 315 ( 2001 ).	en_US
dc.identifier.citedreference	Y. He, R. Hattori, and J. Kanicki, IEEE Elec. Dev. Lett. 21, 590 ( 2000 ).	en_US
dc.identifier.citedreference	Hack, M., Kwong, R., Weaver, M.S., Lu, M., and Brown, J.J., Proc. of IDMC, 57 ( 2002 ).	en_US
dc.identifier.citedreference	Sasaoka, T., Sekiya, M., Yumoto, A., Yamada, J., Hirano, T., Iwase, Y., Yamada, T., Ishibashi, T., Mori, T., Asano, M., Tamura, S., and Urabe, T., Proc. of SID Sym., 384 ( 2001 ).	en_US
dc.owningcollname	Interdisciplinary and Peer-Reviewed

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