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Mapping of femtosecond laser-induced collateral damage by electron backscatter diffraction

dc.contributor.authorKumar, Anishen_US
dc.contributor.authorPollock, Tresa M.en_US
dc.date.accessioned2013-07-03T19:31:40Z
dc.date.available2013-07-03T19:31:40Z
dc.date.issued2011-10-15en_US
dc.identifier.citationKumar, Anish; Pollock, Tresa M. (2011). "Mapping of femtosecond laser-induced collateral damage by electron backscatter diffraction." Journal of Applied Physics, 110(8): 83114. <http://hdl.handle.net/2027.42/98720>en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/98720
dc.publisherThe American Institute of Physicsen_US
dc.subjectDislocation Densityen_US
dc.subjectElectron Backscatteringen_US
dc.subjectElectron Diffractionen_US
dc.subjectHigh-speed Optical Techniquesen_US
dc.subjectLaser Materials Processingen_US
dc.subjectNickel Alloysen_US
dc.subjectShock Wavesen_US
dc.subjectSuperalloysen_US
dc.titleMapping of femtosecond laser-induced collateral damage by electron backscatter diffractionen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelPhysicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/98720/1/JApplPhys_110_083114.pdf
dc.identifier.doi10.1063/1.3653839en_US
dc.identifier.sourceJournal of Applied Physicsen_US
dc.owningcollnamePhysics, Department of


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