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Mosquera, J-M.; Perner, Sven; Demichelis, F.; Kim, R.; Hofer, M. D.; Mertz, K. D.; Paris, P. L.; Simko, J.; Collins, C.; Bismar, T. A.; Chinnaiyan, Arul M.; Rubin, Mark A. (John Wiley & Sons, Ltd., 2007-05)
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