Deep Blue: Browsing by Author "Guzman, Luis"

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Improving die rework capability: Opportunities for using 3D non-contact measurement technology to reduce die tryout iterations to resolve dimensional issues

Hammett, Patrick C.; Geddes, Steven W.; Guzman, Luis (University of Michigan, Ann Arbor, Transportation Research Institute, 2008-05)

(1.6MB)
Integrating 3D non-contact measurement in the die tryout business process

Hammett, Patrick C.; Geddes, Steven W.; Guzman, Luis (University of Michigan, Ann Arbor, Transportation Research Institute, 2008-05)

(385.1KB)