Heuvel, Odile A.; Boedhoe, Premika S.W.; Bertolin, Sara; Bruin, Willem B.; Francks, Clyde; Ivanov, Iliyan; Jahanshad, Neda; Kong, Xiang-Zhen; Kwon, Jun Soo; O’Neill, Joseph; Paus, Tomas; Patel, Yash; Piras, Fabrizio; Schmaal, Lianne; Soriano-Mas, Carles; Spalletta, Gianfranco; Wingen, Guido A.; Yun, Je-Yeon; Vriend, Chris; Simpson, H. Blair; Rooij, Daan; Hoexter, Marcelo Q.; Hoogman, Martine; Buitelaar, Jan K.; Arnold, Paul; Beucke, Jan C.; Benedetti, Francesco; Bollettini, Irene; Bose, Anushree; Brennan, Brian P.; De Nadai, Alessandro S.; Fitzgerald, Kate; Gruner, Patricia; Grünblatt, Edna; Hirano, Yoshiyuki; Huyser, Chaim; James, Anthony; Koch, Kathrin; Kvale, Gerd; Lazaro, Luisa; Lochner, Christine; Marsh, Rachel; Mataix-Cols, David; Morgado, Pedro; Nakamae, Takashi; Nakao, Tomohiro; Narayanaswamy, Janardhanan C.; Nurmi, Erika; Pittenger, Christopher; Reddy, Y.C. Janardhan; Sato, João R.; Soreni, Noam; Stewart, S. Evelyn; Taylor, Stephan F.; Tolin, David; Thomopoulos, Sophia I.; Veltman, Dick J.; Venkatasubramanian, Ganesan; Walitza, Susanne; Wang, Zhen; Thompson, Paul M.; Stein, Dan J.; Abe, Yoshinari (John Wiley & Sons, Inc., 2022-01)
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