Now showing items 1-4 of 4
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Rosellini, Anthony J.; Heeringa, Steven G.; Stein, Murray B.; Ursano, Robert J.; Chiu, Wai Tat; Colpe, Lisa J.; Fullerton, Carol S.; Gilman, Stephen E.; Hwang, Irving; Naifeh, James A.; Nock, Matthew K.; Petukhova, Maria; Sampson, Nancy A.; Schoenbaum, Michael; Zaslavsky, Alan M.; Kessler, Ronald C. (Rand CorporationWiley Periodicals, Inc., 2015-01)
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Nock, Matthew K.; Ursano, Robert J.; Heeringa, Steven G.; Stein, Murray B.; Jain, Sonia; Raman, Rema; Sun, Xiaoying; Chiu, Wai Tat; Colpe, Lisa J.; Fullerton, Carol S.; Gilman, Stephen E.; Hwang, Irving; Naifeh, James A.; Rosellini, Anthony J.; Sampson, Nancy A.; Schoenbaum, Michael; Zaslavsky, Alan M.; Kessler, Ronald C. (Biometrics Research, New York State Psychiatric InstituteWiley Periodicals, Inc., 2015-10)
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Ursano, Robert J.; Heeringa, Steven G.; Stein, Murray B.; Jain, Sonia; Raman, Rema; Sun, Xiaoying; Chiu, Wai Tat; Colpe, Lisa J.; Fullerton, Carol S.; Gilman, Stephen E.; Hwang, Irving; Naifeh, James A.; Nock, Matthew K.; Rosellini, Anthony J.; Sampson, Nancy A.; Schoenbaum, Michael; Zaslavsky, Alan M.; Kessler, Ronald C. (Wiley Periodicals, Inc.Plenum, 2015-01)
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Kessler, Ronald C.; Berglund, Patricia A.; Chiu, Wai Tat; Demler, Olga; Heeringa, Steven G.; Hiripi, Eva; Jin, Robert; Pennell, Beth-Ellen; Walters, Ellen E.; Zaslavsky, Alan M.; Zheng, Hui (John Wiley & Sons, Ltd., 2004-06)