Now showing items 1-7 of 7
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Ngo, K. Q.; Philipp, P.; Jin, Y.; Morris, S. E.; Shtein, Max; Kieffer, Jean-Claude; Wirtz, T. (John Wiley & Sons, Ltd., 2011-01)
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Ngo, K. Q.; Philipp, P.; Jin, Y.; Morris, S. E.; Shtein, Max; Kieffer, Jean-Claude; Wirtz, T. (John Wiley & Sons, Ltd., 2011-01)
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Jin, Y.; Skaar, T.; Storniolo, A.; Desta, Z.; Nguyen, A.; Li, L.; Hayes, D.; Flockhart, D. A.; Stearns, V. (Wiley Periodicals, Inc., 2005-02)
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Nguyen, A.T.; Jin, Y.; Rehman, M.; Li, L.; Skaar, T.C.; Stearns, V.; Hayes, D.F.; Flockhart, D.A. (Wiley Periodicals, Inc., 2005-02)
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Pii‐18 Ntukidem, N. I.; Li, L.; Rehman, M. I.; Skaar, T. C.; Jin, Y.; Desta, Z.; Storniolo, A. M.; Stearns, V.; Hayes, D. F.; Flockhart, D. A. (Wiley Periodicals, Inc., 2006-02)
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Pii‐21 Hwang, J.; Jin, Y.; Storniolo, A. M.; Hayes, D. F.; Li, L.; Stearn, V.; Skaar, T. C.; Flockhart, D. A. (Wiley Periodicals, Inc., 2006-02)
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Jin, Y.; Ward, B.; Storniolo, A.; Desta, Z.; Nguyen, A.; Hayes, D.; Stearns, V.; Flockhart, D. A. (Wiley Periodicals, Inc., 2005-02)