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    • Kunz, Clayton; Murphy, Chris; Camilli, Richard; Singh, Hanumant; Bailey, John; Eustice, Ryan M.; Jakuba, Michael; Nakamura, Ko-ichi; Roman, Christopher; Sato, Taichi; Sohn, Robert A.; Willis, Claire (IEEE, 2008-09-22)
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    • Humphris, S. E.; Herzig, P. M.; Miller, D. J.; Alt, Jeffrey C.; Becker, K.; Brown, D.; Brugmann, G.; Chiba, H.; Fouquet, Y.; Gemmell, J. B.; Guerin, G.; Hannington, M. D.; Holm, N. G.; Honnorez, J. J.; Iturrino, G. J.; Knott, R.; Ludwig, R.; Nakamura, Ko-ichi; Petersen, S.; Reysenbach, A. L.; Rona, P. A.; Smith, S.; Sturz, A. A.; Tivey, M. K.; Zhao, X. (Macmillan Magazines Ltd., 1995-10-26)
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    • Kunz, Clayton; Murphy, Chris; Singh, Hanumant; Pontbriand, Claire; Sohn, Robert A.; Singh, Sandipa; Sato, Taichi; Roman, Christopher; Nakamura, Ko-ichi; Jakuba, Michael; Eustice, Ryan M.; Camilli, Richard; Bailey, John (Wiley Subscription Services, Inc., A Wiley Company, 2009-04)
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