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Bilevel Image Similarity Ground Truth Archive
dc.contributor.authorZhai, Yuanhao
dc.contributor.authorNeuhoff, David
dc.date.accessioned2015-05-01T03:37:13Z
dc.date.available2015-05-01T03:37:13Z
dc.date.issued2015-05-01
dc.identifier.urihttps://hdl.handle.net/2027.42/111059
dc.descriptionThe data in this file is intended for scholarly, non-commercial use only. The images cannot be re-distributed. Copyright to the data is retained by Yuanhao Zhai and David L. Neuhoff. If issues arise, please contact [email protected] or [email protected].en_US
dc.description.abstractThis archive contains a set of seven bilevel images, the same images distorted in a number of ways and to a number of different degrees, subjective rating scores for each distorted image as to its similarity to its corresponding original, and the amounts of time required for the rating of each image.en_US
dc.language.isoen_USen_US
dc.subjectbilevel image similarityen_US
dc.subjectbilevel image similarity ground truthen_US
dc.subjectsubjective evaluationen_US
dc.titleBilevel Image Similarity Ground Truth Archiveen_US
dc.typeDataseten_US
dc.subject.hlbsecondlevelElectrical Engineering
dc.subject.hlbsecondlevelComputer Science
dc.subject.hlbtoplevelEngineering
dc.contributor.affiliationumElectrical Engineering and Computer Science, Department ofen_US
dc.contributor.affiliationumcampusAnn Arboren_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/111059/3/Bilevel Image Similarity Ground Truth Archive.zip
dc.owningcollnameElectrical Engineering and Computer Science, Department of (EECS)


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