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Multiple testing for neuroimaging via hidden Markov random field

dc.contributor.authorShu, Haien_US
dc.contributor.authorNan, Binen_US
dc.contributor.authorKoeppe, Roberten_US
dc.date.accessioned2015-10-07T20:43:10Z
dc.date.available2016-10-10T14:50:23Zen
dc.date.issued2015-09en_US
dc.identifier.citationShu, Hai; Nan, Bin; Koeppe, Robert (2015). "Multiple testing for neuroimaging via hidden Markov random field." Biometrics 71(3): 741-750.en_US
dc.identifier.issn0006-341Xen_US
dc.identifier.issn1541-0420en_US
dc.identifier.urihttps://hdl.handle.net/2027.42/113759
dc.publisherWiley Periodicals, Inc.en_US
dc.subject.otherIsing modelen_US
dc.subject.otherLocal significance indexen_US
dc.subject.otherPenalized likelihooden_US
dc.subject.otherGeneralized expectation–maximization algorithmen_US
dc.subject.otherFalse discovery rateen_US
dc.subject.otherAlzheimer's diseaseen_US
dc.titleMultiple testing for neuroimaging via hidden Markov random fielden_US
dc.typeArticleen_US
dc.rights.robotsIndexNoFollowen_US
dc.subject.hlbsecondlevelMathematicsen_US
dc.subject.hlbtoplevelScienceen_US
dc.description.peerreviewedPeer Revieweden_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/113759/1/biom12329-sup-0001-SuppData.pdf
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/113759/2/biom12329.pdf
dc.identifier.doi10.1111/biom.12329en_US
dc.identifier.sourceBiometricsen_US
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dc.owningcollnameInterdisciplinary and Peer-Reviewed


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