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Cutset Width and Spacing for Reduced Cutset Coding of Markov Random Fields

dc.contributor.authorReyes, Matthew
dc.contributor.authorNeuhoff, David
dc.date.accessioned2016-02-23T21:38:40Z
dc.date.available2016-02-23T21:38:40Z
dc.date.issued2016-02-23
dc.identifier.urihttps://hdl.handle.net/2027.42/117382
dc.description.abstractIn this paper we explore tradeoffs, regarding coding performance, between the thickness and spacing of the cutset used in Reduced Cutset Coding (RCC) of a Markov random field image model \cite{reyes2010}. Considering MRF models on a square lattice of sites, we show that under a stationarity condition, increasing the thickness of the cutset reduces coding rate for the cutset, increasing the spacing between components of the cutset increases the coding rate of the non-cutset pixels, though the coding rate of the latter is always strictly less than that of the former. We show that the redundancy of RCC can be decomposed into two terms, a correlation redundancy due to coding the components of the cutset independently, and a distribution redundancy due to coding the cutset as a reduced MRF. We provide analysis of these two sources of redundancy. We present results from numerical simulations with a homogeneous Ising model that bear out the analytical results. We also present a consistent estimation algorithm for the moment-matching reduced MRF for the cutset.en_US
dc.language.isoen_USen_US
dc.subjectMarkov fields, source coding, moment-matching, parameter estimation, monotonicityen_US
dc.titleCutset Width and Spacing for Reduced Cutset Coding of Markov Random Fieldsen_US
dc.typeArticleen_US
dc.subject.hlbsecondlevelElectrical Engineering
dc.subject.hlbsecondlevelComputer Science
dc.subject.hlbtoplevelEngineering
dc.contributor.affiliationumElectrical Engineering and Computer Science, Department ofen_US
dc.contributor.affiliationumcampusAnn Arboren_US
dc.description.bitstreamurlhttp://deepblue.lib.umich.edu/bitstream/2027.42/117382/1/mgreyes_dlneuhoff_ISIT_2016_fullpaper_deepblue.pdf
dc.description.filedescriptionDescription of mgreyes_dlneuhoff_ISIT_2016_fullpaper_deepblue.pdf : article
dc.owningcollnameElectrical Engineering and Computer Science, Department of (EECS)


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