Relative dosimetry using active matrix flatâ panel imager (AMFPI) technology
dc.contributor.author | El‐mohri, Y. | |
dc.contributor.author | Antonuk, L. E. | |
dc.contributor.author | Yorkston, J. | |
dc.contributor.author | Jee, K.‐w. | |
dc.contributor.author | Maolinbay, M. | |
dc.contributor.author | Lam, K. L. | |
dc.contributor.author | Siewerdsen, J. H. | |
dc.date.accessioned | 2017-01-06T20:49:17Z | |
dc.date.available | 2017-01-06T20:49:17Z | |
dc.date.issued | 1999-08 | |
dc.identifier.citation | El‐mohri, Y. ; Antonuk, L. E.; Yorkston, J.; Jee, K.‐w. ; Maolinbay, M.; Lam, K. L.; Siewerdsen, J. H. (1999). "Relative dosimetry using active matrix flatâ panel imager (AMFPI) technology." Medical Physics 26(8): 1530-1541. | |
dc.identifier.issn | 0094-2405 | |
dc.identifier.issn | 2473-4209 | |
dc.identifier.uri | https://hdl.handle.net/2027.42/135008 | |
dc.publisher | American Association of Physicists in Medicine | |
dc.publisher | Wiley Periodicals, Inc. | |
dc.subject.other | relative dosimetry | |
dc.subject.other | active matrix flatâ panel imager | |
dc.subject.other | electronic portal imager | |
dc.subject.other | Electronic devices | |
dc.subject.other | Amorphous semiconductors | |
dc.subject.other | Data acquisition | |
dc.subject.other | Quality assurance | |
dc.subject.other | Thin film transistors | |
dc.subject.other | Photons | |
dc.subject.other | Radiation therapy | |
dc.subject.other | Photodiodes | |
dc.subject.other | Medical imaging | |
dc.subject.other | Dosimetry | |
dc.subject.other | biomedical electronics | |
dc.subject.other | quality control | |
dc.subject.other | thin film transistors | |
dc.subject.other | photodiodes | |
dc.subject.other | radiation therapy | |
dc.subject.other | dosimetry | |
dc.subject.other | flat panel displays | |
dc.subject.other | Quality assurance in radiotherapy | |
dc.subject.other | Photodiodes; phototransistors; photoresistors | |
dc.subject.other | Display and recording equipment, oscilloscopes, TV cameras, etc. | |
dc.subject.other | Quality assurance equipment | |
dc.subject.other | amorphous silicon | |
dc.subject.other | quality assurance | |
dc.title | Relative dosimetry using active matrix flatâ panel imager (AMFPI) technology | |
dc.type | Article | en_US |
dc.rights.robots | IndexNoFollow | |
dc.subject.hlbsecondlevel | Medicine (General) | |
dc.subject.hlbtoplevel | Health Sciences | |
dc.description.peerreviewed | Peer Reviewed | |
dc.contributor.affiliationum | Department of Radiation Oncology, University of Michigan Medical Center, Ann Arbor, Michigan 48109 | |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/135008/1/mp8649.pdf | |
dc.identifier.doi | 10.1118/1.598649 | |
dc.identifier.source | Medical Physics | |
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dc.owningcollname | Interdisciplinary and Peer-Reviewed |
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