Now showing items 1-6 of 6
Ion‐Migration Phenomena Observed with the Electron Microscope
(The American Institute of Physics, 1945-06)
The Calculation of the Contribution of Freely Rotating Groups to Electron Scattering by Gases
(The American Institute of Physics, 1945-04)
The contribution from freely rotating atoms to the intensity of electron scattering by gaseous molecules is obtained by means of an asymptotic evaluation of an integral, using the saddle point method. It is possible now ...
Additional Stabilization for the Beam Current in the RCA Type B Electron Microscope
(The American Institute of Physics, 1945-03)
A Shadow Casting Unit for the RCA Electron Microscope
(The American Institute of Physics, 1945-10)