Work Function Modification via Combined Charge‐Based Through‐Space Interaction and Surface Interaction
dc.contributor.author | Yang, Da Seul | |
dc.contributor.author | Bilby, David | |
dc.contributor.author | Chung, Kyeongwoon | |
dc.contributor.author | Wenderott, Jill K. | |
dc.contributor.author | Jordahl, Jacob | |
dc.contributor.author | Kim, Bo Hyun | |
dc.contributor.author | Lahann, Joerg | |
dc.contributor.author | Green, Peter F. | |
dc.contributor.author | Kim, Jinsang | |
dc.date.accessioned | 2018-09-04T20:08:41Z | |
dc.date.available | 2019-09-04T20:15:39Z | en |
dc.date.issued | 2018-08 | |
dc.identifier.citation | Yang, Da Seul; Bilby, David; Chung, Kyeongwoon; Wenderott, Jill K.; Jordahl, Jacob; Kim, Bo Hyun; Lahann, Joerg; Green, Peter F.; Kim, Jinsang (2018). "Work Function Modification via Combined Charge‐Based Through‐Space Interaction and Surface Interaction." Advanced Materials Interfaces 5(15): n/a-n/a. | |
dc.identifier.issn | 2196-7350 | |
dc.identifier.issn | 2196-7350 | |
dc.identifier.uri | https://hdl.handle.net/2027.42/145536 | |
dc.description.abstract | Work function modification of electrodes is an important factor to achieve high performance in organic electronics. However, a clear explanation of the origin of work function modification has remained elusive. Here, it is investigated how the work function of electrodes is affected by the charge‐based through‐space interaction with the well‐known surface interaction. The studies reveal that the formation of a surface dipole leads to a work function shift, even when the work function modifying layer and substrate are separated. A work function shift is also demonstrated by electrophoretic deposition of ionic polyelectrolytes while the same polyelectrolytes do not cause any work function shift when they are spin cast. More noteworthy is that a neutral (nonionic) polymer which has no specific surface‐interacting functional groups can induce work function shift of its substrate by a charge‐based through‐space interaction when deposited by electrospraying. These results provide a more comprehensive understanding of work function modification and motivate the design and selection of a wide range of effective work function modifying layers for organic electronics.Work function modification of indium tin oxide (ITO) by thin‐layer polymer coating is investigated with a set of representative polyelectrolytes. The studies reveal that while direct surface interaction is the major factor affecting work function modification, charge‐based through‐space interaction has also a significant effect on modifying the work function of electrodes by building opposite charges on ITO. | |
dc.publisher | W. H. Freeman and Company | |
dc.publisher | Wiley Periodicals, Inc. | |
dc.subject.other | organic electronics | |
dc.subject.other | polyelectrolyte | |
dc.subject.other | work function | |
dc.title | Work Function Modification via Combined Charge‐Based Through‐Space Interaction and Surface Interaction | |
dc.type | Article | en_US |
dc.rights.robots | IndexNoFollow | |
dc.subject.hlbsecondlevel | Materials Science and Engineering | |
dc.subject.hlbtoplevel | Engineering | |
dc.description.peerreviewed | Peer Reviewed | |
dc.description.bitstreamurl | https://deepblue.lib.umich.edu/bitstream/2027.42/145536/1/admi201800471-sup-0001-S1.pdf | |
dc.description.bitstreamurl | https://deepblue.lib.umich.edu/bitstream/2027.42/145536/2/admi201800471.pdf | |
dc.description.bitstreamurl | https://deepblue.lib.umich.edu/bitstream/2027.42/145536/3/admi201800471_am.pdf | |
dc.identifier.doi | 10.1002/admi.201800471 | |
dc.identifier.source | Advanced Materials Interfaces | |
dc.identifier.citedreference | B. H. Lee, I. H. Jung, H. Y. Woo, H. K. Shim, G. Kim, K. Lee, Adv. Funct. Mater. 2014, 24, 1100. | |
dc.identifier.citedreference | K.‐G. Lim, M.‐R. Choi, T.‐W. Lee, Mater. Today Energy 2017, 5, 66. | |
dc.identifier.citedreference | K.‐G. Lim, S. M. Park, H. Y. Woo, T.‐W. Lee, ChemSusChem 2015, 8, 3062. | |
dc.identifier.citedreference | L.‐M. Chen, Z. Xu, Z. Hong, Y. Yang, J. Mater. Chem. 2010, 20, 2575. | |
dc.identifier.citedreference | R. Xia, D.‐S. Leem, T. Kirchartz, S. Spencer, C. Murphy, Z. He, H. Wu, S. Su, Y. Cao, J. S. Kim, J. C. Demello, D. D. C. Bradley, J. Nelson, Adv. Energy Mater. 2013, 3, 718. | |
dc.identifier.citedreference | K. Sun, H. Zhang, J. Ouyang, J. Mater. Chem. 2011, 21, 18339. | |
dc.identifier.citedreference | K.‐G. Lim, S. Ahn, T.‐W. Lee, J. Mater. Chem. C 2018, 6, 2915. | |
dc.identifier.citedreference | S. Braun, W. R. Salaneck, M. Fahlman, Adv. Mater. 2009, 21, 1450. | |
dc.identifier.citedreference | J. Schwartz, E. L. Bruner, N. Koch, A. R. Span, S. L. Bernasek, A. Kahn, Synth. Met. 2003, 138, 223. | |
dc.identifier.citedreference | W. Osikowicz, M. P. de Jong, S. Braun, C. Tengstedt, M. Fahlman, W. R. Salaneck, Appl. Phys. Lett. 2006, 88, 193504. | |
dc.identifier.citedreference | G. Witte, S. Lukas, P. S. Bagus, C. Wöll, Appl. Phys. Lett. 2005, 87, 263502. | |
dc.identifier.citedreference | M. T. Greiner, M. G. Helander, W. M. Tang, Z. B. Wang, J. Qiu, Z. H. Lu, Nat. Mater. 2011, 11, 76. | |
dc.identifier.citedreference | J. Niederhausen, P. Amsalem, A. Wilke, R. Schlesinger, S. Winkler, A. Vollmer, J. P. Rabe, N. Koch, Phys. Rev. B 2012, 86, 081411(R). | |
dc.identifier.citedreference | M. Oehzelt, N. Koch, G. Heimel, Nat. Commun. 2014, 5, 4174. | |
dc.identifier.citedreference | H. Kang, S. Hong, J. Lee, K. Lee, Adv. Mater. 2012, 24, 3005. | |
dc.identifier.citedreference | R. Schlapak, D. Armitage, N. Saucedo‐zeni, G. Latini, H. J. Gruber, P. Mesquida, Y. Samotskaya, M. Hohage, F. Cacialli, S. Howorka, Langmuir 2007, 23, 8916. | |
dc.identifier.citedreference | Y. Liu, V. V. Duzhko, Z. A. Page, T. Emrick, T. P. Russell, Acc. Chem. Res. 2016, 49, 2478. | |
dc.identifier.citedreference | K. P. Singh, P. N. Gupta, Eur. Polym. J. 1998, 34, 1023. | |
dc.identifier.citedreference | O. Yano, Y. Wada, J. Polym. Sci., Part A‐2: Polym. Phys. 1971, 9, 669. | |
dc.identifier.citedreference | P. Atkins, J. de Paula, Physical Chemistry, 9th ed., W. H. Freeman and Company, NY 2010. | |
dc.identifier.citedreference | P. Sarkar, P. S. Nicholson, J. Am. Ceram. Soc. 1996, 79, 1987. | |
dc.identifier.citedreference | D. Hertkorn, H. C. Elsenheimer, R. Bruch, F. Paul, C. Müller, T. Hanemann, H. Reinecke, J. Appl. Phys. 2013, 114, 027020. | |
dc.identifier.citedreference | C. Cho, K. L. Wallace, D. A. Hagen, B. Stevens, O. Regev, J. C. Grunlan, Nanotechnology 2015, 26, 185703. | |
dc.identifier.citedreference | R. B. Cole, Electrospray and MALDI Mass Spectrometry: Fundamentals, Instrumentation, Practicalities, and Biological Applications, 2nd edition, John Wiley & Sons, Inc., Hoboken, NJ 2010. | |
dc.identifier.citedreference | S. H. Keshmiri, M. Rezaee‐Roknabadi, S. Ashok, Thin Solid Films 2002, 413, 167. | |
dc.identifier.citedreference | D. Bilby, B. Frieberg, S. Kramadhati, P. Green, J. Kim, ACS Appl. Mater. Interfaces 2014, 6, 14964. | |
dc.identifier.citedreference | J. K. Wenderott, B. X. Dong, P. F. Green, J. Mater. Chem. C 2017, 5, 7446. | |
dc.identifier.citedreference | Y. Zhou, C. Fuentes‐Hernandez, J. Shim, J. Meyer, A. J. Giordano, H. Li, P. Winget, T. Papadopoulos, H. Cheun, J. Kim, M. Fenoll, A. Dindar, W. Haske, E. Najafabadi, T. M. Khan, H. Sojoudi, S. Barlow, S. Graham, J. Brédas, S. R. Marder, A. Kahn, B. Kippelen, Science 2012, 336, 327. | |
dc.identifier.citedreference | E. L. Ratcliff, B. Zacher, N. R. Armstrong, J. Phys. Chem. Lett. 2011, 2, 1337. | |
dc.identifier.citedreference | R. Po, C. Carbonera, A. Bernardi, N. Camaioni, Energy Environ. Sci. 2011, 4, 285. | |
dc.identifier.citedreference | Y. H. Kim, T. H. Han, H. Cho, S. Y. Min, C. L. Lee, T. W. Lee, Adv. Funct. Mater. 2014, 24, 3808. | |
dc.identifier.citedreference | R. Shivanna, S. Rajaram, K. S. Narayan, Appl. Phys. Lett. 2015, 106, 123301. | |
dc.identifier.citedreference | Z. He, C. Zhong, S. Su, M. Xu, H. Wu, Y. Cao, Nat. Photonics 2012, 6, 593. | |
dc.identifier.citedreference | H. Li, P. Paramonov, J.‐L. Brédas, J. Mater. Chem. 2010, 20, 2630. | |
dc.identifier.citedreference | H. Wang, E. D. Gomez, Z. Guan, C. Jaye, M. F. Toney, D. A. Fischer, A. Kahn, Y.‐L. Loo, J. Phys. Chem. C 2013, 117, 20474. | |
dc.identifier.citedreference | A. Sharma, A. Haldi, W. J. Potscavage Jr., P. J. Hotchkiss, S. R. Marder, B. Kippelen, J. Mater. Chem. 2009, 19, 5298. | |
dc.identifier.citedreference | J. S. Kim, J. H. Park, J. H. Lee, J. Jo, D.‐Y. Kim, K. Cho, Appl. Phys. Lett. 2007, 91, 112111. | |
dc.identifier.citedreference | W. Osikowicz, X. Crispin, C. Tengstedt, L. Lindell, T. Kugler, W. R. Salaneck, Appl. Phys. Lett. 2004, 85, 1616. | |
dc.identifier.citedreference | C. Ganzorig, K.‐J. Kwak, K. Yagi, M. Fujihira, Appl. Phys. Lett. 2001, 79, 272. | |
dc.identifier.citedreference | H.‐W. Lu, P.‐C. Kao, Y.‐D. Juang, S.‐Y. Chu, J. Appl. Phys. 2015, 118, 185501. | |
dc.identifier.citedreference | S. van Reenen, S. Kouijzer, R. A. J. Janssen, M. M. Wienk, M. Kemerink, Adv. Mater. Interfaces 2014, 1, 1400189. | |
dc.identifier.citedreference | J. Lee, H. Kang, J. Kong, K. Lee, Adv. Energy Mater. 2014, 4, 1301226. | |
dc.identifier.citedreference | H. Wu, F. Huang, J. Peng, Y. Cao, Org. Electron. 2005, 6, 118. | |
dc.identifier.citedreference | B. Bröker, R.‐P. Blum, J. Frisch, A. Vollmer, O. T. Hofmann, R. Rieger, K. Müllen, J. P. Rabe, E. Zojer, N. Koch, Appl. Phys. Lett. 2008, 93, 243303. | |
dc.owningcollname | Interdisciplinary and Peer-Reviewed |
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