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Semiparametric Regression Analysis of Panel Count Data: A Practical Review
dc.contributor.authorChiou, Sy Han
dc.contributor.authorHuang, Chiung‐yu
dc.contributor.authorXu, Gongjun
dc.contributor.authorYan, Jun
dc.date.accessioned2019-05-31T18:24:57Z
dc.date.available2020-06-01T14:50:01Zen
dc.date.issued2019-04
dc.identifier.citationChiou, Sy Han; Huang, Chiung‐yu ; Xu, Gongjun; Yan, Jun (2019). "Semiparametric Regression Analysis of Panel Count Data: A Practical Review." International Statistical Review 87(1): 24-43.
dc.identifier.issn0306-7734
dc.identifier.issn1751-5823
dc.identifier.urihttps://hdl.handle.net/2027.42/149207
dc.publisherCambridge University Press
dc.publisherWiley Periodicals, Inc.
dc.subject.otherrecurrent event
dc.subject.otherCounting process
dc.subject.otherestimating equation
dc.subject.otherfrailty
dc.subject.othermaximum likelihood
dc.titleSemiparametric Regression Analysis of Panel Count Data: A Practical Review
dc.typeArticle
dc.rights.robotsIndexNoFollow
dc.subject.hlbsecondlevelStatistics (Mathematical)
dc.subject.hlbtoplevelScience
dc.description.peerreviewedPeer Reviewed
dc.description.bitstreamurlhttps://deepblue.lib.umich.edu/bitstream/2027.42/149207/1/insr12271_am.pdf
dc.description.bitstreamurlhttps://deepblue.lib.umich.edu/bitstream/2027.42/149207/2/insr12271.pdf
dc.identifier.doi10.1111/insr.12271
dc.identifier.sourceInternational Statistical Review
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dc.owningcollnameInterdisciplinary and Peer-Reviewed


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