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Resonance ionization mass spectrometry of sputtered osmium and rhenium atoms
dc.contributor.authorBlum, Joel D
dc.contributor.authorPennino, Michael J.
dc.contributor.authorCalaway, W.F.
dc.contributor.authorYoung, C.E.
dc.contributor.authorGruen, D.M.
dc.contributor.authorHutcheon, Ian D.
dc.contributor.authorWasserburg, G.J.
dc.date.accessioned2020-06-25T18:49:37Z
dc.date.available2020-06-25T18:49:37Z
dc.date.issued1990
dc.identifier.citationBlum, J.D., Pellin, M.J., Calaway, W.F., Young, C.E., Gruen, D.M., Hutcheon, I.D. and Wasserburg, G.J. (1990) Resonance ionization mass spectrometry of sputtered osmium and rhenium atoms. Analytical Chemistry 62, 209-214.
dc.identifier.issn0003-2700
dc.identifier.urihttps://hdl.handle.net/2027.42/155703
dc.publisherAmerican Chemical Society (ACS)
dc.titleResonance ionization mass spectrometry of sputtered osmium and rhenium atoms
dc.typeArticle
dc.subject.hlbsecondlevelEarth and Environmental Sciences
dc.subject.hlbtoplevelScience
dc.description.peerreviewedPeer Reviewed
dc.description.bitstreamurlhttps://deepblue.lib.umich.edu/bitstream/2027.42/155703/1/Blum_et_al_1990_Resonance_ionization.pdf
dc.identifier.doi10.1021/ac00201a022
dc.identifier.sourceAnalytical Chemistry
dc.identifier.orcid0000-0001-5389-8633
dc.identifier.volume62
dc.identifier.issue2
dc.identifier.startpage209
dc.identifier.endpage214
dc.identifier.name-orcidBlum, Joel; 0000-0001-5389-8633en_US
dc.owningcollnameEarth and Environmental Sciences, Department of


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