High‐Performance Transparent Broadband Microwave Absorbers
dc.contributor.author | Wang, Heyan | |
dc.contributor.author | Zhang, Yilei | |
dc.contributor.author | Ji, Chengang | |
dc.contributor.author | Zhang, Cheng | |
dc.contributor.author | Lu, Zhengang | |
dc.contributor.author | Liu, Yunfei | |
dc.contributor.author | Cao, Zhibo | |
dc.contributor.author | Yuan, Jing | |
dc.contributor.author | Tan, Jiubin | |
dc.contributor.author | Guo, L. Jay | |
dc.date.accessioned | 2022-02-07T20:22:19Z | |
dc.date.available | 2023-03-07 15:22:17 | en |
dc.date.available | 2022-02-07T20:22:19Z | |
dc.date.issued | 2022-02 | |
dc.identifier.citation | Wang, Heyan; Zhang, Yilei; Ji, Chengang; Zhang, Cheng; Lu, Zhengang; Liu, Yunfei; Cao, Zhibo; Yuan, Jing; Tan, Jiubin; Guo, L. Jay (2022). "High‐Performance Transparent Broadband Microwave Absorbers." Advanced Materials Interfaces 9(4): n/a-n/a. | |
dc.identifier.issn | 2196-7350 | |
dc.identifier.issn | 2196-7350 | |
dc.identifier.uri | https://hdl.handle.net/2027.42/171526 | |
dc.description.abstract | The ability to absorb a broad frequency range of microwaves is essential for improving the performance of various electromagnetic interference shielding applications. However, the achievement of broadband microwave absorption with high optical transparency remains a long‐standing and unsolved challenge. Here, a simple and powerful method for high‐efficiency broadband microwave absorption is presented by introducing strongly overlapped multi‐cavity resonances, which is supported by multi‐layer structures comprising of alternating graphene/silica pairs and ultrathin silver films. A design guideline for achieving broadband absorption in multi‐layer structures is proposed and, more importantly, the complementary effect of different graphene layers on the microwave absorption mechanism is revealed for the first time, providing a new analytical perspective. Experiments show that the absorption efficiency of the proposed multi‐layer structures is near unity (≈100%) at resonant peaks with absorption bandwidths (≥50%) up to ≈30 GHz within the measured range of 32 GHz. In addition, the multi‐layer structures exhibit highly visible transmittance ranging from ≈85.8% to 68.0%. The proposed general theoretical framework and physical insights in combination with experimental demonstrations lay the foundation for designing a new type of transparent broadband microwave absorber.A multi‐layered structure consisting of graphene/silica units and ultrathin Ag films for transparent broadband microwave absorbers is demonstrated. A design guideline for achieving broadband absorption in multi‐layer structures is proposed and, more importantly, the complementary effect of different graphene layers on the microwave absorption mechanism is revealed, providing a new analytical perspective. | |
dc.publisher | Wiley Periodicals, Inc. | |
dc.subject.other | optical transparency | |
dc.subject.other | ultrathin silver films | |
dc.subject.other | broadband absorption | |
dc.subject.other | graphene | |
dc.subject.other | perfect microwave absorber | |
dc.title | High‐Performance Transparent Broadband Microwave Absorbers | |
dc.type | Article | |
dc.rights.robots | IndexNoFollow | |
dc.subject.hlbsecondlevel | Materials Science and Engineering | |
dc.subject.hlbtoplevel | Engineering | |
dc.description.peerreviewed | Peer Reviewed | |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/171526/1/admi202101714_am.pdf | |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/171526/2/admi202101714-sup-0001-SuppMat.pdf | |
dc.description.bitstreamurl | http://deepblue.lib.umich.edu/bitstream/2027.42/171526/3/admi202101714.pdf | |
dc.identifier.doi | 10.1002/admi.202101714 | |
dc.identifier.source | Advanced Materials Interfaces | |
dc.identifier.citedreference | H. Sheokand, G. Singh, S. Ghosh, J. Ramkumar, S. Ramakrishna, K. Srivastava, IEEE Antennas Wireless Propag. Lett. 2019, 18, 113. | |
dc.identifier.citedreference | H. Chen, W. Ma, Z. Huang, Y. Zhang, Y. Huang, Y. Chen, Adv. Opt. Mater. 2019, 7, 1801318. | |
dc.identifier.citedreference | B. Wu, H. Tuncer, A. Katsounaros, W. Wu, M. Cole, K. Ying, L. Zhang, W. Milne, Y. Hao, Carbon 2014, 77, 814. | |
dc.identifier.citedreference | K. Zhang, J. Zhang, Z. Hou, S. Bi, Q. Zhao, Carbon 2019, 141, 608. | |
dc.identifier.citedreference | D. Yi, X. Wei, Y. Xu, IEEE Trans. Microwave Theory Tech. 2017, 65, 2819. | |
dc.identifier.citedreference | Y. Bai, B. Zhong, Y. Yu, M. Wang, J. Zhang, B. Zhang, K. Gao, A. Liang, C. Wang, J. Zhang, npj 2D Mater. Appl. 2019, 3, 32. | |
dc.identifier.citedreference | Z. Lu, L. Ma, J. Tan, H. Wang, X. Ding, Nanoscale 2016, 8, 16684. | |
dc.identifier.citedreference | K. Batrakov, P. Kuzhir, S. Maksimenko, A. Paddubskaya, S. Voronovich, P. Lambin, T. Kaplas, Y. Svirko, Sci. Rep. 2014, 4, 7191. | |
dc.identifier.citedreference | B. Wu, H. Tuncer, M. Naeem, B. Yang, M. Cole, W. Milne, Y. Hao, Sci. Rep. 2014, 4, 4130. | |
dc.identifier.citedreference | Y. Chang, C. Liu, C. Liu, S. Zhang, S. Marder, E. Narimanov, Z. Zhong, T. Norris, Nat. Commun. 2016, 7, 10568. | |
dc.identifier.citedreference | I. Iorsh, I. Mukhin, I. Shadrivov, P. Belov, Y. Kivshar, Phys. Rev. B: Condens. Matter Mater. Phys. 2013, 87, 075416. | |
dc.identifier.citedreference | M. Othman, C. Guclu, F. Capolino, Opt. Express 2013, 21, 7614. | |
dc.identifier.citedreference | L. Wang, Z. Ma, Y. Zhang, L. Chen, D. Cao, J. Gu, SusMat 2021, 1, 413. | |
dc.identifier.citedreference | F. Qi, L. Wang, Y. Zhang, Z. Ma, H. Qiu, J. Gu, Mater. Today Phys. 2021, 21, 100512. | |
dc.identifier.citedreference | L. Wang, X. Shi, J. Zhang, Y. Zhang, J. Gu, J. Mater. Sci. Technol. 2020, 52, 119. | |
dc.identifier.citedreference | H. Y. Wang, C. G. Ji, C. Zhang, Y. L. Zhang, Z. Zhang, Z. G. Lu, J. B. Tan, L. J. Guo, ACS Appl. Mater. Interfaces 2019, 11, 11782. | |
dc.identifier.citedreference | C. Zhang, Q. Y. Huang, Q. Y. Cui, C. G. Ji, Z. Zhang, X. Chen, T. George, S. L. Zhao, L. J. Guo, ACS Appl. Mater. Interfaces 2019, 11, 27216. | |
dc.identifier.citedreference | C. Zhang, C. Ji, Y. B. Park, L. J. Guo, Adv. Opt. Mater. 2020, 9, 2001298. | |
dc.identifier.citedreference | A. Siokou, F. Ravani, O. F. S. Karakalos, M. Kalbac, C. Galiotis, Appl. Surf. Sci. 2011, 257, 9785. | |
dc.identifier.citedreference | R. Stine, J. W. Ciszek, D. E. Barlow, W. K. Lee, J. T. Robinson, P. E. Sheehan, Langmuir 2012, 28, 7957. | |
dc.identifier.citedreference | X. Gao, S. Wang, J. Li, Y. Zheng, R. Zhang, P. Zhou, Y. Yang, L. Chen, Thin Solid Films 2004, 455, 438. | |
dc.identifier.citedreference | Z. Yang, Y. Chen, Y. Zhou, Y. Wang, P. Dai, X. Zhu, H. Duan, Adv. Opt. Mater. 2017, 5, 1700029. | |
dc.identifier.citedreference | Z. Li, E. Palacios, S. Butun, H. Kocer, K. Aydin, Sci. Rep. 2015, 5, 15137. | |
dc.identifier.citedreference | L. Zhu, F. Liu, H. Lin, J. Hu, Z. Yu, X. Wang, S. Fan, Light: Sci. Appl. 2016, 5, e16052. | |
dc.identifier.citedreference | L. Jia, D. Yan, X. Liu, R. Ma, H. Wu, Z. Li, ACS Appl. Mater. Interfaces 2018, 10, 11941. | |
dc.identifier.citedreference | Y. G. Bi, Y. F. Liu, X. L. Zhang, D. Yin, W. Q. Wang, J. Feng, H. B. Sun, Adv. Opt. Mater. 2019, 7, 1800778. | |
dc.identifier.citedreference | X. Liang, J. Lu, T. Zhao, X. Yu, Q. Jiang, Y. Hu, P. Zhu, R. Sun, C. P. Wong, Adv. Mater. Interfaces 2019, 6, 1801635. | |
dc.identifier.citedreference | J. Lu, Y. Zhang, Y. Tao, B. Wang, W. Cheng, G. Jie, L. Song, Y. Hu, J. Colloid Interface Sci. 2020, 588, 164. | |
dc.identifier.citedreference | S. K. Guo, J. Deng, J. Zhou, Y. Yu, Y. Bu, T. Zhu, X. Ren, Z. Li, W. Lu, X. Chen, Opt. Express 2021, 29, 9269. | |
dc.identifier.citedreference | Y. Yu, J. Zhou, Q. Cai, Z. Chu, J. Deng, W. Lu, Z. Li, X. Chen, Opt. Lett. 2021, 46, 2236. | |
dc.identifier.citedreference | S. Guo, D. Zhang, J. Zhou, J. Deng, Y. Yu, J. Deng, Q. Cai, Z. Li, W. Lu, X. Chen, Carbon 2020, 170, 49. | |
dc.identifier.citedreference | S. Hong, K. Kim, T. Kim, J. Kim, S. Park, J. Kim, B. Cho, Nanotechnology 2012, 23, 455704. | |
dc.identifier.citedreference | S. Kim, J. Oh, M. Kim, W. Jang, M. Wang, Y. Kim, H. Seo, Y. Kim, J. Lee, Y. Lee, J. Nam, ACS Appl. Mater. Interfaces 2014, 6, 17647. | |
dc.identifier.citedreference | D. Yi, X. C. Wei, Y. Xu, IEEE Trans. Nanotechnol. 2017, 16, 484. | |
dc.identifier.citedreference | R. Deng, K. Zhang, M. Li, L. Song, T. Zhang, Mater. Des. 2019, 162, 119. | |
dc.identifier.citedreference | S. Lai, Y. Wu, X. Zhu, W. Gu, W. Wu, IEEE Photonics J. 2017, 9, 1. | |
dc.identifier.citedreference | I. Lee, S. Yoon, J. Lee, I. Hong, Electron. Lett. 2016, 52, 555. | |
dc.identifier.citedreference | C. Zhang, Q. Cheng, J. Yang, J. Zhao, T. Cui, Appl. Phys. Lett. 2017, 110, 722. | |
dc.identifier.citedreference | H. Sheokand, S. Ghosh, G. Singh, M. Saikia, K. Srivastava, J. Ramkumar, S. Ramakrishna, J. Appl. Phys. 2017, 122, 105105. | |
dc.identifier.citedreference | J. Zhao, C. Zhang, Q. Cheng, J. Yang, T. Cui, Appl. Phys. Lett. 2018, 112, 073504. | |
dc.identifier.citedreference | K. Chen, L. Cui, Y. J. Feng, J. Zhao, T. Jiang, B. Zhu, Opt. Express 2017, 25, 5571. | |
dc.identifier.citedreference | D. Hu, J. Cao, W. Li, C. Zhang, T. Wu, Q. Li, Z. Chen, Y. Wang, J. Guan, Adv. Opt. Mater. 2017, 5, 1700109. | |
dc.identifier.citedreference | H. Xiong, J. Hong, C. Luo, L. Zhong, J. Appl. Phys. 2013, 114, 064109. | |
dc.identifier.citedreference | F. Ding, Y. Cui, X. Ge, Y. Jin, S. L. He, Appl. Phys. Lett. 2012, 100, 103506. | |
dc.identifier.citedreference | T. Jang, H. Youn, Y. J. Shin, L. J. Guo, ACS Photonics 2014, 1, 279. | |
dc.identifier.citedreference | P. Min, Z. Song, L. Yang, B. Dai, J. Zhu, Opt. Express 2020, 28, 19518. | |
dc.identifier.citedreference | Q. Zhou, X. Yin, F. Ye, R. Mo, Z. Tang, X. Fan, L. Cheng, L. Zhang, Appl. Phys. A: Mater. Sci. Process. 2019, 125, 131. | |
dc.identifier.citedreference | Y. Wu, J. Wang, S. Lai, X. Zhu, W. Gu, AIP Adv. 2019, 9, 025309. | |
dc.identifier.citedreference | W. Lu, J. Wang, J. Zhang, Z. Liu, H. Chen, W. Song, Z. Jiang, Carbon 2019, 152, 70. | |
dc.identifier.citedreference | H. Chen, W. Lu, Z. Liu, J. Zhang, A. Zhang, B. Wu, IEEE Trans. Microwave Theory Tech. 2018, 66, 3807. | |
dc.identifier.citedreference | O. Balci, E. Polat, N. Kakenov, C. Kocabas, Nat. Commun. 2015, 6, 6628. | |
dc.identifier.citedreference | F. Shahzad, M. Alhabeb, C. Hatter, B. Anasori, S. Hong, C. Koo, Y. Gogotsi, Science 2016, 353, 1137. | |
dc.identifier.citedreference | P. Kumar, Adv. Mater. Interfaces 2019, 6, 1901454. | |
dc.identifier.citedreference | H. Wang, Y. Zhang, C. Ji, C. Zhang, D. Liu, Z. Zhang, Z. Lu, J. Tan, L. J. Guo, Adv. Sci. 2019, 6, 1901320. | |
dc.identifier.citedreference | J. Huang, T. Wang, Y. Su, Y. Ding, C. Tu, W. Li, Adv. Mater. Interfaces 2021, 8, 2100186. | |
dc.identifier.citedreference | M. Yang, Q. Wei, J. Li, Y. Wang, H. Guo, L. Gao, L. Huang, X. He, Y. Li, Y. Yuan, Adv. Mater. Interfaces 2020, 7, 1901815. | |
dc.identifier.citedreference | T. Almoneef, O. Ramahi, Appl. Phys. Lett. 2015, 106, 153902. | |
dc.identifier.citedreference | Y. Han, Y. X. Liu, L. Han, J. Lin, P. Jin, Carbon 2017, 115, 34. | |
dc.identifier.citedreference | Z. Lu, L. Ma, J. Tan, H. Wang, X. Ding, 2D Mater. 2017, 4, 025021. | |
dc.identifier.citedreference | R. Deng, K. Zhan, M. Li, L. Song, T. Zhang, Mater. Des. 2018, 162, 119. | |
dc.identifier.citedreference | D. Yoo, D. Won, W. Cho, J. Lim, J. Kim, Adv. Mater. Technol. 2021, 2100358. | |
dc.identifier.citedreference | S. Lai, Y. Wu, X. Zhu, W. Gu, W. Wen, IEEE Photonics J. 2017, 9, 1. | |
dc.identifier.citedreference | M. Grande, G. Bianco, M. Vincenti, D. Ceglia, P. Capezzuto, V. Petruzzelli, M. Scalora, G. Bruno, A. D’Orazio, Opt. Express 2016, 24, 22788. | |
dc.working.doi | NO | en |
dc.owningcollname | Interdisciplinary and Peer-Reviewed |
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